Crystal structure and spectral photosensitivity of thermally evaporated ZnxCd1-xSe thin films

Journal of Physics D: Applied Physics

Volumn 44, Issue 41, 2011, Pages

  Nesheva, D ^a   Aneva, Z ^a   Scepanovic, M J ^b   Levi, Z ^a   Iordanova, I ^c   Popovic, Z V ^b  

^a INSTITUTE OF SOLID STATE PHYSICS   (Bulgaria)

^b UNIVERSITY OF BELGRADE   (Serbia)

^c UNIVERSITY OF SOFIA   (Bulgaria)

Author keywords

[No Author keywords available]

Indexed keywords

CDSE FILMS; CUBIC STRUCTURE; DEPOSITION OF FILMS; EQUIVALENT THICKNESS; FILM CRYSTALLINITY; NANO-SIZED; NANOCRYSTALLINES; RAMAN DATA; SINGLE LAYER; SPECTRAL PHOTOCURRENT; TERNARY FILM; THERMAL-VACUUM EVAPORATION;

CADMIUM ALLOYS; CADMIUM COMPOUNDS; CRYSTAL STRUCTURE; LIGHT SENSITIVE MATERIALS; PHOTOSENSITIVITY; RAMAN SCATTERING; SEMICONDUCTING SELENIUM COMPOUNDS; THERMAL EVAPORATION; VACUUM EVAPORATION; X RAY DIFFRACTION; ZINC;

FILM PREPARATION;

EID: 80053358805     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/44/41/415305     Document Type: Article

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