Preparation and characterization of semiconducting Zn1-xCd xSe thin films

Solar Energy Materials and Solar Cells

Volumn 81, Issue 3, 2004, Pages 371-378

  Chandramohan, R ^a   Mahalingam, T ^a   Chu, J P ^b   Sebastian, P J ^c,d  

^a ALAGAPPA UNIVERSITY   (India)

^b NATIONAL TAIWAN OCEAN UNIVERSITY   (Taiwan)

^c INSTITUTO DE CIENCIAS FÍSICAS   (Mexico)

^d INSTITUTO MEXICANO DEL PETRÓLEO   (Mexico)

Author keywords

Electrodeposition; Optical properties; Thin film; Voltammetry; Zn1 xCdxSe

Indexed keywords

CYCLIC VOLTAMMETRY; DIFFRACTOMETERS; ELECTRODEPOSITION; ENERGY DISPERSIVE SPECTROSCOPY; FILM GROWTH; INTERFEROMETERS; POLYCRYSTALLINE MATERIALS; REDUCTION; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING ZINC COMPOUNDS; SOLAR CELLS; SURFACE STRUCTURE; ULTRAVIOLET SPECTROPHOTOMETERS; X RAY DIFFRACTION ANALYSIS;

BAND GAP VALUES; TRANSMISSION SPECTRA; ZN1-XCDXSE;

SEMICONDUCTING FILMS;

EID: 1042269640     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2003.11.013     Document Type: Conference Paper

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