X-ray laue diffraction microscopy in 3D at the advanced photon source

AIP Conference Proceedings

Volumn 1365, Issue , 2010, Pages 108-111

  Liu, W ^a   Zschack, P ^a   Tischler, J ^b   Ice, G ^b   Larson, B ^b  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Laue diffraction; micro diffraction; X ray microscopy

Indexed keywords

EID: 80053324213     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3625316     Document Type: Conference Paper

References (8)

1. B. C. Larson, W. Yang, G. E. Ice, J. D. Budai, and J. Z. Tischler, Nature 415, 887 (2002).
2. W. Liu, G. E. Ice, B. C. Larson, W. Yang, and J. Z. Tischler, Ultramicroscopy 103, 199 (2005).
3. B. C. Larson, J. Z. Tischler, A. El-Azab, and W. Liu, J. Eng. Mater.-T ASME 130, 021024-1 (2008).
4. W. Liu et al., Rev. Sci. Instrum. 76, 113701 (2005).
5. L. E. Levine et al., Nat. Materials 5, 619 (2006).
6. M. Sobiech et al., Appl. Phys. Lett. 94, 221901 (2009).
7. L. Wang et al., Proc. Natl. Acad. Sci. USA 107, 6140 (2010).
8. W. L. Mao et al., Proc. Natl. Acad. Sci. USA 107, 9965 (2010).