Electrodeposition and characterization of CoNiMnP-based permanent magnetic film for MEMS applications

NEMS 2011 - 6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems

Volumn , Issue , 2011, Pages 367-371

  Sun, Xu Ming ^a   Yuan, Quan ^a   Fang, Dong Ming ^b   Zhang, Hai Xia ^a  

^a PEKING UNIVERSITY   (China)

^b INSTITUTE OF ELECTRONICS   (China)

Author keywords

CoNiMnP; Electrodeposition; Hysteresis loops; Permanent film

Indexed keywords

CONIMNP; ENERGY DENSITY; MEMS APPLICATIONS; PERMANENT FILM; PERMANENT MAGNETIC FILMS; THICKNESS DEPENDENCE;

COERCIVE FORCE; ELECTRODEPOSITION; HYSTERESIS LOOPS; MAGNETIC DEVICES; MAGNETIC FILMS; MAGNETIC MATERIALS; MAGNETIC THICK FILMS; MANGANESE; MORPHOLOGY; PERMANENT MAGNETS; SURFACE MORPHOLOGY; THICK FILMS;

COBALT;

EID: 80053321762     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NEMS.2011.6017369     Document Type: Conference Paper

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