메뉴 건너뛰기




Volumn 1365, Issue , 2010, Pages 144-147

Development of an advanced sample-scanning stage system prototype for an MLL-based hard X-ray Nanoprobe

Author keywords

flexure; laser interferometric encoder; Nanopositioning; weak link; x ray nanoprobe

Indexed keywords


EID: 80053295742     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3625325     Document Type: Conference Paper
Times cited : (8)

References (12)
  • 4
    • 80053318281 scopus 로고    scopus 로고
    • U.S. Patent No. 7,597,475
    • D. Shu, H. Yan, and J. Maser, U.S. Patent No. 7,597,475 (2009).
    • (2009)
    • Shu, D.1    Yan, H.2    Maser, J.3
  • 8
    • 80053301353 scopus 로고    scopus 로고
    • U.S. Patent application ANL-IN-08-013
    • D. Shu and J. Maser, U.S. Patent application ANL-IN-08-013.
    • Shu, D.1    Maser, J.2
  • 9
    • 80053325677 scopus 로고    scopus 로고
    • Physik Instrumente (PI) is a trademark of the Physik Instrumente GmbH & Co. Germany
    • Physik Instrumente (PI) is a trademark of the Physik Instrumente GmbH & Co. Germany.
  • 10
    • 80053314499 scopus 로고    scopus 로고
    • Newport is a trademark of the Newport Co. USA
    • Newport is a trademark of the Newport Co. USA.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.