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Volumn 1365, Issue , 2010, Pages 144-147
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Development of an advanced sample-scanning stage system prototype for an MLL-based hard X-ray Nanoprobe
a a b b b b a,c a,c a b |
Author keywords
flexure; laser interferometric encoder; Nanopositioning; weak link; x ray nanoprobe
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Indexed keywords
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EID: 80053295742
PISSN: 0094243X
EISSN: 15517616
Source Type: Conference Proceeding
DOI: 10.1063/1.3625325 Document Type: Conference Paper |
Times cited : (8)
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References (12)
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