Applications of laminar weak-link mechanisms for ultraprecision synchrotron radiation instruments

AIP Conference Proceedings

Volumn 879, Issue , 2007, Pages 1073-1076

  Shu, D ^a   Toellner, T S ^a   Alp, E E ^a   Maser, J ^a   Ilavsky, J ^a   Shastri, S D ^a   Lee, P L ^a   Narayanan, S ^a   Long, G G ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Flexure mechanism; Weak link mechanism; X ray microscope; X ray monochromator

Indexed keywords

EID: 33947417589     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2436249     Document Type: Conference Paper

References (12)

1. T. S. Toellner, T. Mooney, S. Shastri, and E. E. Alp, SPIE Proc. vol. 1740 (1992) pp. 218.
2. D. Shu, T. S. Toellner, and E. E. Alp, Nucl. Instrum. Methods A 467-468, 771-774 (2001).
3. E. E. Alp et al., Hyperfine Interactions 90 (1994) pp. 323.
4. U.S. Patent granted No. 6,607,840, D. Shu, T. S. Toellner, and E. E. Alp, 2003.
5. T. S. Toellner, APS Science 2004, ANL-05/04, p. 130
6. S. Narayanan et al., This conference.
7. Y. Zhang, A. P. Wilkinson, P. L. Lee, S. D. Shastri, D. Shu, D. -Y. Chung, M. G. Kanatzidis, J. Appl. Cryst. 38, 433-441 (2005).
8. B. Jakobsen, H. F. Poulsen, U. Lienert, J. Almer, S. D. Shastri, H. Sorensen, C. Gundlach, W. Pantleon, Science 312, 889-892 (2006).
9. J. Ilavsky, This conference.
10. P. Lee, M. A. Beno, D. Shu, M. Ramanathan, J. F. Mitchell, J. D. Jorgensen, and R. B. Von Dreele, SRI 2003 Conf. Proc. 705, AIP (2004) 388-391.
11. D. Shu, Y. Han, T. S. Toellner, and E. E. Alp, Proc. SPIE Vol. 4771 (2002) pp. 78-90.
12. U.S. Patent granted No. 6,822,733, D. Shu, 2004.