SCOPUS 정보 검색 플랫폼

Volumn 184, Issue 10, 2011, Pages 2683-2689

The influence of diffusion temperature on the structural, optical and magnetic properties of manganese-doped zinc oxysulfide thin films

(5) Polat, I a Aksu, S b Altunbas M a Ylmaz, S a Bacaksz, E a

a KARADENIZ TECHNICAL UNIVERSITY (Turkey)

b SoloPower Inc (United States)

Author keywords

Annealing; Ferromagnetism; Mn doped zinc oxysulfide; Semiconductors; Thin films; XPS

Indexed keywords

BAND INTENSITY; DEEP LEVEL; DIFFUSION TEMPERATURE; GAP ENERGY; GLASS SUBSTRATES; HEXAGONAL PLANES; MN-DOPED; OPTICAL TRANSMISSION MEASUREMENTS; PREFERRED ORIENTATIONS; REGULAR ARRAY; SPRAY PYROLYSIS METHOD; UNDOPED FILMS; WURTZITES; XRD PATTERNS; ZN(O ,S); ZNO;

ANNEALING; DIFFUSION; FERROMAGNETISM; LIGHT TRANSMISSION; MAGNETIC PROPERTIES; POINT DEFECTS; SEMICONDUCTOR DOPING; SEMICONDUCTOR MATERIALS; SPRAY PYROLYSIS; SUBSTRATES; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC; ZINC OXIDE; ZINC SULFIDE;

MANGANESE;

EID: 80053219704 PISSN: 00224596 EISSN: 1095726X Source Type: Journal
DOI: 10.1016/j.jssc.2011.07.017 Document Type: Article

Times cited : (29)

References (63)

1
- 21544455020
- J.K. Furdyna J. Appl. Phys. 64 1988 R29 R64
- (1988) J. Appl. Phys. , vol.64
- Furdyna, J.K.¹

2
- 1542422810
- S.V. Molnar, and D. Read Proc. IEEE 91 2003 715 726
- (2003) Proc. IEEE , vol.91 , pp. 715-726
- Molnar, S.V.¹ Read, D.²

3
- 0032516694
- H. Ohno Science 28 1998 951 956
- (1998) Science , vol.28 , pp. 951-956
- Ohno, H.¹

4
- 5544320365
- S.J. Pearton, W.H. Heo, M. Ivill, D.P. Norton, and T. Steiner Semicond. Sci. Technol. 19 2004 R59 R74
- (2004) Semicond. Sci. Technol. , vol.19
- Pearton, S.J.¹ Heo, W.H.² Ivill, M.³ Norton, D.P.⁴ Steiner, T.⁵

5
- 0037258011
- S.J. Pearton, C.R. Abernathy, M.E. Overberg, G.T. Thaler, D.P. Norton, N. Theodoropoulou, A.F. Hebard, Y.D. Park, F. Ren, J. Kim, and L.A. Boatner J. Appl. Phys. 93 2003 1 13
- (2003) J. Appl. Phys. , vol.93 , pp. 1-13
- Pearton, S.J.¹ Abernathy, C.R.² Overberg, M.E.³ Thaler, G.T.⁴ Norton, D.P.⁵ Theodoropoulou, N.⁶ Hebard, A.F.⁷ Park, Y.D.⁸ Ren, F.⁹ Kim, J.¹⁰ Boatner, L.A.¹¹

6
- 0035900398
- S.A. Wolf, D.D. Awschalom, R.A. Buhrman, J.M. Daughton, S. von Molnár, M.L. Roukes, A.Y. Chtchelkanova, and D.M. Treger Science 294 2001 1488 1495
- (2001) Science , vol.294 , pp. 1488-1495
- Wolf, S.A.¹ Awschalom, D.D.² Buhrman, R.A.³ Daughton, J.M.⁴ Von Molnár, S.⁵ Roukes, M.L.⁶ Chtchelkanova, A.Y.⁷ Treger, D.M.⁸

7
- 0033552926
- J.M. Kikkawa, and D.D. Awschalom Nature 397 1999 139 141
- (1999) Nature , vol.397 , pp. 139-141
- Kikkawa, J.M.¹ Awschalom, D.D.²

8
- 0036532149
- T. Dietl Semicond. Sci. Technol. 17 2002 377 392
- (2002) Semicond. Sci. Technol. , vol.17 , pp. 377-392
- Dietl, T.¹

9
- 0035886230
- Y.Z. Yoo, T. Fukumura, Z. Jin, K. Hasegawa, M. Kawasaki, P. Ahmet, T. Chikyow, and H. Kainuma J. Appl. Phys. 90 2001 4246 4250
- (2001) J. Appl. Phys. , vol.90 , pp. 4246-4250
- Yoo, Y.Z.¹ Fukumura, T.² Jin, Z.³ Hasegawa, K.⁴ Kawasaki, M.⁵ Ahmet, P.⁶ Chikyow, T.⁷ Kainuma, H.⁸

10
- 0031167317
- S. Koshihara, A. Oiwa, M. Hirasawa, S. Katsumoto, Y. Iye, C. Uramo, H. Takagi, and H. Munekata Phys. Rev. Lett. 78 1997 4617 4620
- (1997) Phys. Rev. Lett. , vol.78 , pp. 4617-4620
- Koshihara, S.¹ Oiwa, A.² Hirasawa, M.³ Katsumoto, S.⁴ Iye, Y.⁵ Uramo, C.⁶ Takagi, H.⁷ Munekata, H.⁸

11
- 0042530105
- A.M. Nazmul, S. Sugahara, and M. Tanaka Phys. Rev. B 67 2003 241308 241311
- (2003) Phys. Rev. B , vol.67 , pp. 241308-241311
- Nazmul, A.M.¹ Sugahara, S.² Tanaka, M.³

12
- 0034635396
- D. Dietl, H. Ohno, F. Matsukura, J. Cibert, and F. Ferrand Science 287 2000 1019 1022
- (2000) Science , vol.287 , pp. 1019-1022
- Dietl, D.¹ Ohno, H.² Matsukura, F.³ Cibert, J.⁴ Ferrand, F.⁵

13
- 0348050704
- S.J. Potashnik, K.C. Ku, S.H. Chun, J.J. Berry, N. Samarth, and P. Schiffer Appl. Phys. Lett. 79 2001 1495 1497
- (2001) Appl. Phys. Lett. , vol.79 , pp. 1495-1497
- Potashnik, S.J.¹ Ku, K.C.² Chun, S.H.³ Berry, J.J.⁴ Samarth, N.⁵ Schiffer, P.⁶

14
- 41549128052
- Ü. Alver, E. Bacaksz, and E. Yanmaz J. Alloys Compd. 456 2008 6 9
- (2008) J. Alloys Compd. , vol.456 , pp. 6-9
- Alver, U.¹ Bacaksz, E.² Yanmaz, E.³

15
- 0001450586
- T. Fukumura, Z. Jin, M. Kawasaki, T. Shono, T. Hasegawa, S. Koshihara, and H. Koinuma Appl. Phys. Lett. 78 2001 958 960
- (2001) Appl. Phys. Lett. , vol.78 , pp. 958-960
- Fukumura, T.¹ Jin, Z.² Kawasaki, M.³ Shono, T.⁴ Hasegawa, T.⁵ Koshihara, S.⁶ Koinuma, H.⁷

16
- 7544236267
- H.J. Yuan, X.Q. Yan, Z.X. Zhang, D.F. Liu, Z.P. Zhou, L. Cao, J.X. Wang, Y. Gao, L. Song, L.F. Liu, X.W. Zhao, X.Y. Dou, W.Y. Zhou, and S.S. Xie J. Cryst. Growth 271 2004 403 408
- (2004) J. Cryst. Growth , vol.271 , pp. 403-408
- Yuan, H.J.¹ Yan, X.Q.² Zhang, Z.X.³ Liu, D.F.⁴ Zhou, Z.P.⁵ Cao, L.⁶ Wang, J.X.⁷ Gao, Y.⁸ Song, L.⁹ Liu, L.F.¹⁰ Zhao, X.W.¹¹ Dou, X.Y.¹² Zhou, W.Y.¹³ Xie, S.S.¹⁴

17
- 2542485837
- H. Deng, J.J. Russell, R.N. Lamb, and B. Jiang Thin Solid Films 458 2004 43 46
- (2004) Thin Solid Films , vol.458 , pp. 43-46
- Deng, H.¹ Russell, J.J.² Lamb, R.N.³ Jiang, B.⁴

18
- 0030562199
- A.J.C. Fiddes, K. Durose, A.W. Bringman, J. Woods, P.D. Coates, and A.J. Banister J. Cryst. Growth 159 1996 210 213
- (1996) J. Cryst. Growth , vol.159 , pp. 210-213
- Fiddes, A.J.C.¹ Durose, K.² Bringman, A.W.³ Woods, J.⁴ Coates, P.D.⁵ Banister, A.J.⁶

19
- 77954089453
- J. Qi, D.Q. Gao, J.H. Liu, W.G. Yang, Q. Wang, J.Y. Zhou, Y.H. Yang, and J.L. Liu Appl. Phys. A-Mater. 100 2010 79 82
- (2010) Appl. Phys. A-Mater. , vol.100 , pp. 79-82
- Qi, J.¹ Gao, D.Q.² Liu, J.H.³ Yang, W.G.⁴ Wang, Q.⁵ Zhou, J.Y.⁶ Yang, Y.H.⁷ Liu, J.L.⁸

20
- 79955401772
- Y.F. Tian, Y.F. Li, M. He, I.A. Putra, H.Y. Peng, B. Yao, S.A. Cheong, and T. Wu Appl. Phys. Lett. 98 2011 162503 162506
- (2011) Appl. Phys. Lett. , vol.98 , pp. 162503-162506
- Tian, Y.F.¹ Li, Y.F.² He, M.³ Putra, I.A.⁴ Peng, H.Y.⁵ Yao, B.⁶ Cheong, S.A.⁷ Wu, T.⁸

21
- 0001349237
- C. Falcony, M. Garcia, A. Ortiz, and J.C. Alonso J. Appl. Phys. 72 1992 1525
- (1992) J. Appl. Phys. , vol.72 , pp. 1525
- Falcony, C.¹ Garcia, M.² Ortiz, A.³ Alonso, J.C.⁴

22
- 0036542617
- I.T. Sorokina, E. Sorokin, S. Mirov, V. Fedorov, V. Badikov, V. Panyutin, A. Di Lieto, and M. Tonelli Appl. Phys. B 74 2002 607 611
- (2002) Appl. Phys. B , vol.74 , pp. 607-611
- Sorokina, I.T.¹ Sorokin, E.² Mirov, S.³ Fedorov, V.⁴ Badikov, V.⁵ Panyutin, V.⁶ Di Lieto, A.⁷ Tonelli, M.⁸

23
- 66249115339
- B.X. Fang, Y. Bando, M. Liao, U.K. Gautam, C. Zhi, B. Dierre, B. Liu, T. Zhai, T. Sekiguchi, Y. Koide, and D. Golberg Adv. Mater. 21 2009 2034 2039
- (2009) Adv. Mater. , vol.21 , pp. 2034-2039
- Fang, B.X.¹ Bando, Y.² Liao, M.³ Gautam, U.K.⁴ Zhi, C.⁵ Dierre, B.⁶ Liu, B.⁷ Zhai, T.⁸ Sekiguchi, T.⁹ Koide, Y.¹⁰ Golberg, D.¹¹

24
- 34347326064
- I. Sarkar, M.K. Sanyal, S. Kar, S. Biswas, S. Banerjee, S. Chaudhuri, S. Takeyama, H. Mino, and F. Komori Phys. Rev. B 75 2007 224409-5
- (2007) Phys. Rev. B , vol.75 , pp. 224409-5
- Sarkar, I.¹ Sanyal, M.K.² Kar, S.³ Biswas, S.⁴ Banerjee, S.⁵ Chaudhuri, S.⁶ Takeyama, S.⁷ Mino, H.⁸ Komori, F.⁹

25
- 22744452198
- W.Q. Peng, S.C. Qu, G.W. Cong, X.Q. Zhang, and Z.G. Wang J. Cryst. Growth 282 2005 179 185
- (2005) J. Cryst. Growth , vol.282 , pp. 179-185
- Peng, W.Q.¹ Qu, S.C.² Cong, G.W.³ Zhang, X.Q.⁴ Wang, Z.G.⁵

26
- 0041324804
- B.W. Sanders, and A. Kitai Chem. Mater. 4 1992 1005 1011
- (1992) Chem. Mater. , vol.4 , pp. 1005-1011
- Sanders, B.W.¹ Kitai, A.²

27
- 77954620635
- S.H. Duelkar, J.-L. Huang, and M. Neumann-Spallart J. Electron. Mater. 39 2010 589 594
- (2010) J. Electron. Mater. , vol.39 , pp. 589-594
- Duelkar, S.H.¹ Huang, J.-L.² Neumann-Spallart, M.³

28
- 0033908148
- E.B. Yousfi, T. Asikainen, V. Pietu, P. Cowache, M. Powalla, and D. Lincot Thin Solid Films 361 2000 183 186
- (2000) Thin Solid Films , vol.361 , pp. 183-186
- Yousfi, E.B.¹ Asikainen, T.² Pietu, V.³ Cowache, P.⁴ Powalla, M.⁵ Lincot, D.⁶

29
- 33748324828
- C. Platzer-Björkman, T. Törndahl, D. Abou-Ras, J. Malmström, J. Kessler, and L. Stolt J. Appl. Phys. 100 2006 044506 044515
- (2006) J. Appl. Phys. , vol.100 , pp. 044506-044515
- Platzer-Björkman, C.¹ Törndahl, T.² Abou-Ras, D.³ Malmström, J.⁴ Kessler, J.⁵ Stolt, L.⁶

30
- 1242313289
- T. Orent J. Vac. Sci. Technol. A 9 1991 2447 2452
- (1991) J. Vac. Sci. Technol. A , vol.9 , pp. 2447-2452
- Orent, T.¹

31
- 33645607584
- B.K. Meyer, A. Polity, B. Farangis, Y. He, D. Hasselkamp, T. Krämer, C. Wang, U. Haboeck, and A. Hoffmann Phys. Status Solidi (c) 1 2004 694 697
- (2004) Phys. Status Solidi (C) , vol.1 , pp. 694-697
- Meyer, B.K.¹ Polity, A.² Farangis, B.³ He, Y.⁴ Hasselkamp, D.⁵ Krämer, T.⁶ Wang, C.⁷ Haboeck, U.⁸ Hoffmann, A.⁹

32
- 0036709378
- N.A. Vlasenko, M.B. Kotlyarevsky, Z.L. Denisova, V.V. Kidalov, Y.F. Kononets, A.S. Revenko, and L.I. Veligura Phys. Status Solidi (a) 193 2002 338 346
- (2002) Phys. Status Solidi (A) , vol.193 , pp. 338-346
- Vlasenko, N.A.¹ Kotlyarevsky, M.B.² Denisova, Z.L.³ Kidalov, V.V.⁴ Kononets, Y.F.⁵ Revenko, A.S.⁶ Veligura, L.I.⁷

33
- 55349091317
- E. Bacaksiz, M. Tomakin, M. Altunbaş, M. Parlak, and T. Çolakolu Phys. B: Condens. Matter 403 2008 3740 3745
- (2008) Phys. B: Condens. Matter , vol.403 , pp. 3740-3745
- Bacaksiz, E.¹ Tomakin, M.² Altunbaş, M.³ Parlak, M.⁴ Çolakolu, T.⁵

34
- 0039306711
- H. McMurdie, M. Morris, E. Evans, B. Paretzkin, W. Wong-Ng, L. Ettlinger, and C. Hubbard Powder Diffr. 1 1986 77
- (1986) Powder Diffr. , vol.1 , pp. 77
- McMurdie, H.¹ Morris, M.² Evans, E.³ Paretzkin, B.⁴ Wong-Ng, W.⁵ Ettlinger, L.⁶ Hubbard, C.⁷

35
- 0002074393
- H. McMurdie, M. Morris, E. Evans, B. Paretzkin, W. Wong-Ng, L. Ettlinger, and C. Hubbard Powder Diffr. 1 1986 76
- (1986) Powder Diffr. , vol.1 , pp. 76
- McMurdie, H.¹ Morris, M.² Evans, E.³ Paretzkin, B.⁴ Wong-Ng, W.⁵ Ettlinger, L.⁶ Hubbard, C.⁷

36
- 60849109250
- P. Singh, A. Kaushal, and D. Kaur J. Alloys Compd. 471 2009 11 15
- (2009) J. Alloys Compd. , vol.471 , pp. 11-15
- Singh, P.¹ Kaushal, A.² Kaur, D.³

37
- 0032805724
- O. Zelaya-Angel, A. Picos-Vega, R. Ramirez-Bon, and F.J. Espinoza-Beltran Vacuum 41 1999 99 102
- (1999) Vacuum , vol.41 , pp. 99-102
- Zelaya-Angel, O.¹ Picos-Vega, A.² Ramirez-Bon, R.³ Espinoza-Beltran, F.J.⁴

38
- 55349144173
- H. Metin, F. Sat, S. Erat, and M. Ar J. Optoelectron. Adv. Mater. 10 2008 2622 2930
- (2008) J. Optoelectron. Adv. Mater. , vol.10 , pp. 2622-2930
- Metin, H.¹ Sat, F.² Erat, S.³ Ar, M.⁴

39
- 33746885471
- P.A.G. Beermann, B.R. McGarvey, B.O. Skadtchenko, S. Muralidharan, and R.C.W. Sung J. Nanopart. Res. 8 2006 235 241
- (2006) J. Nanopart. Res. , vol.8 , pp. 235-241
- Beermann, P.A.G.¹ McGarvey, B.R.² Skadtchenko, B.O.³ Muralidharan, S.⁴ Sung, R.C.W.⁵

40
- 67349155545
- R.K. Singhal, M.S. Dhawan, S.K. Gaur, S.N. Dolia, S. Kumar, T. Shripathi, U.P. Deshpande, Y.T. Xing, E. Saitovitch, and K.B. Garg J. Alloys Compd. 477 2009 379 385
- (2009) J. Alloys Compd. , vol.477 , pp. 379-385
- Singhal, R.K.¹ Dhawan, M.S.² Gaur, S.K.³ Dolia, S.N.⁴ Kumar, S.⁵ Shripathi, T.⁶ Deshpande, U.P.⁷ Xing, Y.T.⁸ Saitovitch, E.⁹ Garg, K.B.¹⁰

41
- 0017907723
- R.O. Ansell, T. Dickinson, and A.F. Povey Corros. Sci. 18 1978 245 256
- (1978) Corros. Sci. , vol.18 , pp. 245-256
- Ansell, R.O.¹ Dickinson, T.² Povey, A.F.³

42
- 0042284756
- Y. Umezawa, and C.N. Reilley Anal. Chem. 50 1978 1290 1295
- (1978) Anal. Chem. , vol.50 , pp. 1290-1295
- Umezawa, Y.¹ Reilley, C.N.²

43
- 77952884038
- S. Singhal, A.K. Chawla, H.O. Gupta, and R. Chandra Nanoscale Res. Lett. 5 2010 323 331
- (2010) Nanoscale Res. Lett. , vol.5 , pp. 323-331
- Singhal, S.¹ Chawla, A.K.² Gupta, H.O.³ Chandra, R.⁴

44
- 25144462707
- Ü. Özgür, Y.I. Alivov, C. Liu, A. Teke, M.A. Reshchikov, S. Dogan, V. Avrutin, S.J. Cho, and H. Morkoc J. Appl. Phys. 98 2005 041301 041404
- (2005) J. Appl. Phys. , vol.98 , pp. 041301-041404
- Özgür, U.¹ Alivov, Y.I.² Liu, C.³ Teke, A.⁴ Reshchikov, M.A.⁵ Dogan, S.⁶ Avrutin, V.⁷ Cho, S.J.⁸ Morkoc, H.⁹

45
- 0742285721
- N. Karar, F. Singh, and B.R. Mehta J. Appl. Phys. 95 2004 656 661
- (2004) J. Appl. Phys. , vol.95 , pp. 656-661
- Karar, N.¹ Singh, F.² Mehta, B.R.³

46
- 36048957969
- R. Sharma, and H.S. Bhatti Nanotechnology 18 2007 465703 465710
- (2007) Nanotechnology , vol.18 , pp. 465703-465710
- Sharma, R.¹ Bhatti, H.S.²

47
- 77953289960
- R. Kripala, A.K. Gupta, S.K. Mishrab, R.K. Srivastavab, A.C. Pandeyc, and S.G. Prakash Spectrochim. Acta A 76 2010 523 530
- (2010) Spectrochim. Acta A , vol.76 , pp. 523-530
- Kripala, R.¹ Gupta, A.K.² Mishrab, S.K.³ Srivastavab, R.K.⁴ Pandeyc, A.C.⁵ Prakash, S.G.⁶

48
- 78049433352
- G. Murugadoss, B. Rajamannan, and V. Ramasamy J. Lumin. 130 2010 2032 2039
- (2010) J. Lumin. , vol.130 , pp. 2032-2039
- Murugadoss, G.¹ Rajamannan, B.² Ramasamy, V.³

49
- 34548037919
- H. Liu, X. Zhang, L. Li, Y.X. Wang, K.H. Gao, Z.Q. Li, R.K. Zheng, S.P. Ringer, B. Zhang, and X.X. Zhang Appl. Phys. Lett. 91 2007 072511 072514
- (2007) Appl. Phys. Lett. , vol.91 , pp. 072511-072514
- Liu, H.¹ Zhang, X.² Li, L.³ Wang, Y.X.⁴ Gao, K.H.⁵ Li, Z.Q.⁶ Zheng, R.K.⁷ Ringer, S.P.⁸ Zhang, B.⁹ Zhang, X.X.¹⁰

50
- 78650549846
- T.T. Quynh Hoa, N. Duc The, S. McVitie, N.H. Nam, L. Van Vu, T.D. Canh, and N.N. Long Opt. Mater. 33 2011 308 314
- (2011) Opt. Mater. , vol.33 , pp. 308-314
- Quynh Hoa, T.T.¹ Duc The, N.² McVitie, S.³ Nam, N.H.⁴ Van Vu, L.⁵ Canh, T.D.⁶ Long, N.N.⁷

51
- 33244473695
- H.Y. Xu, Y.C. Liu, C.S. Xu, Y.X. Liu, C.L. Shao, and R. Mu J. Chem. Phys. 124 2006 074707 074711
- (2006) J. Chem. Phys. , vol.124 , pp. 074707-074711
- Xu, H.Y.¹ Liu, Y.C.² Xu, C.S.³ Liu, Y.X.⁴ Shao, C.L.⁵ Mu, R.⁶

52
- 43949122887
- J. Elanchezhiyan, K.P. Bhuvana, N. Gopalakrishnan, and T. Balasubramanian Mater. Lett. 62 2008 3379 3381
- (2008) Mater. Lett. , vol.62 , pp. 3379-3381
- Elanchezhiyan, J.¹ Bhuvana, K.P.² Gopalakrishnan, N.³ Balasubramanian, T.⁴

53
- 23744483853
- W. Chen, L.F. Zhao, Y.Q. Wang, J.H. Miao, S. Liu, Z.C. Xia, and S.L. Yuan Appl. Phys. Lett. 87 2005 042507 042510
- (2005) Appl. Phys. Lett. , vol.87 , pp. 042507-042510
- Chen, W.¹ Zhao, L.F.² Wang, Y.Q.³ Miao, J.H.⁴ Liu, S.⁵ Xia, Z.C.⁶ Yuan, S.L.⁷

54
- 33847191685
- H.L. Yan, X.L. Zhong, J.B. Wang, G.J. Huang, S.L. Ding, G.C. Zhou, and Y.C. Zhou Appl. Phys. Lett. 90 2007 082503 082506
- (2007) Appl. Phys. Lett. , vol.90 , pp. 082503-082506
- Yan, H.L.¹ Zhong, X.L.² Wang, J.B.³ Huang, G.J.⁴ Ding, S.L.⁵ Zhou, G.C.⁶ Zhou, Y.C.⁷

55
- 77950985813
- C. Bi, L. Pan, M. Xu, L. Qin, J. Yin, in: Proceedings of the Ninth IEEE Conference on Nanotechnology, 2009, pp. 874877.
- (2009) Proceedings of the Ninth IEEE Conference on Nanotechnology , pp. 874-877
- Bi, C.¹ Pan, L.² Xu, M.³ Qin, L.⁴ Yin, J.⁵

56
- 79956009402
- S.W. Jung, S.J. An, G.C. Yi, C.U. Jung, S.I. Lee, and S. Cho Appl. Phys. Lett. 80 2002 4561 4563
- (2002) Appl. Phys. Lett. , vol.80 , pp. 4561-4563
- Jung, S.W.¹ An, S.J.² Yi, G.C.³ Jung, C.U.⁴ Lee, S.I.⁵ Cho, S.⁶

57
- 9744229200
- S. Kolesnik, and B. Dabrowski J. Appl. Phys. 96 2004 5379 5381
- (2004) J. Appl. Phys. , vol.96 , pp. 5379-5381
- Kolesnik, S.¹ Dabrowski, B.²

58
- 53349151540
- S. Delikanli, S. He, Y. Qin, P. Zhang, H. Zeng, H. Zhang, and M. Swihart Appl. Phys. Lett. 93 2008 132501 132503
- (2008) Appl. Phys. Lett. , vol.93 , pp. 132501-132503
- Delikanli, S.¹ He, S.² Qin, Y.³ Zhang, P.⁴ Zeng, H.⁵ Zhang, H.⁶ Swihart, M.⁷

59
- 79951708648
- S. Bhattacharyya, Y. Estrin, D.H. Rich, D. Zitoun, Y. Koltypin, and A. Gedanken J. Phys. Chem. C 114 2010 22002 22011
- (2010) J. Phys. Chem. C , vol.114 , pp. 22002-22011
- Bhattacharyya, S.¹ Estrin, Y.² Rich, D.H.³ Zitoun, D.⁴ Koltypin, Y.⁵ Gedanken, A.⁶

60
- 77954215266
- J. Xie J. Magn. Magn. Mater. 322 2010 L37 L41
- (2010) J. Magn. Magn. Mater. , vol.322
- Xie, J.¹

61
- 34547770370
- D.S. Kim, Y.J. Cho, J. Park, J. Yoon, Y. Jo, and M.H. Jung J. Phys. Chem. C 111 2007 10861 10868
- (2007) J. Phys. Chem. C , vol.111 , pp. 10861-10868
- Kim, D.S.¹ Cho, Y.J.² Park, J.³ Yoon, J.⁴ Jo, Y.⁵ Jung, M.H.⁶

62
- 63749089097
- H.T. Xue, and P.Q. Zhao J. Phys. D: Appl. Phys 42 2009 015402 015406
- (2009) J. Phys. D: Appl. Phys , vol.42 , pp. 015402-015406
- Xue, H.T.¹ Zhao, P.Q.²

63
- 70349509092
- S. Sambasivam, D. PaulJoseph, J.G. Lin, and C. Venkateswaran J. Solid State Chem. 182 2009 2598 2601
- (2009) J. Solid State Chem. , vol.182 , pp. 2598-2601
- Sambasivam, S.¹ Pauljoseph, D.² Lin, J.G.³ Venkateswaran, C.⁴

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.