In situ high temperature X-ray diffraction studies of ZnO thin film

Chinese Physics B

Volumn 20, Issue 9, 2011, Pages

  Chen, Xiang Cun ^a   Zhou, Jie Ping ^a   Wang, Hai Yang ^a   Xu, Peng Shou ^a   Pan, Guo Qiang ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

high temperature XRD; lattice parameters; pulsed laser deposition; ZnO thin films

Indexed keywords

HEXAGONAL SYMMETRY; HIGH TEMPERATURE X-RAY DIFFRACTION; HIGH-TEMPERATURE XRD; IN-SITU; SINGLE DOMAINS; WURTZITE STRUCTURE; XRD PATTERNS; ZNO; ZNO THIN FILM;

CRYSTAL ORIENTATION; CRYSTALLITE SIZE; DEPOSITION; EPITAXIAL FILMS; EPITAXIAL GROWTH; LATTICE CONSTANTS; METALLIC FILMS; OPTICAL FILMS; PULSED LASER DEPOSITION; VAPOR DEPOSITION; X RAY DIFFRACTION; ZINC OXIDE; ZINC SULFIDE;

PULSED LASERS;

EID: 80053095504     PISSN: 16741056     EISSN: None     Source Type: Journal    
DOI: 10.1088/1674-1056/20/9/096102     Document Type: Article

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