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Journal of Alloys and Compounds

Volumn 509, Issue 41, 2011, Pages 9930-9933

Electric and dielectric behavior of CaCu3Ti4O 12-based thin films obtained by soft chemical method

(6) Ramirez, M A a Simoes A Z a Felix, A A a Tararam, R a Longo, E a Varela, J A a

a SÃO PAULO STATE UNIVERSITY UNESP (Brazil)

Author keywords

CCTO; Dielectric properties; Electrical properties; Thin films

Indexed keywords

ANNEALING TEMPERATURES; CCTO; CRYSTALLINE STRUCTURE; DIELECTRIC BEHAVIOR; ELECTRICAL AND DIELECTRIC PROPERTIES; ELECTRICAL PROPERTY; EPITAXIAL THIN FILMS; I - V CURVE; NONOHMIC BEHAVIOR; RESISTANCE RANDOM ACCESS MEMORY; ROOM TEMPERATURE; SOFT CHEMICAL METHOD;

ANNEALING; CALCIUM; CALCIUM ALLOYS; DIELECTRIC PROPERTIES; RANDOM ACCESS STORAGE; SURFACE STRUCTURE;

THIN FILMS;

EID: 80052970427 PISSN: 09258388 EISSN: None Source Type: Journal
DOI: 10.1016/j.jallcom.2011.07.098 Document Type: Article

Times cited : (24)

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