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Volumn 51, Issue 9-11, 2011, Pages 1892-1897

Optimization of wire connections design for power electronics

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL METHOD; ANALYTICAL MODEL; AUTOMOTIVE POWER ELECTRONICS; CRACK MECHANISM; JOULE SELF-HEATING; LIFE-TIMES; LOW COSTS; POWER MODULE; WIRE BONDING; WIRE GEOMETRIES; WIRE LENGTH;

EID: 80052927439     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2011.06.058     Document Type: Conference Paper
Times cited : (17)

References (11)
  • 1
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    • Reliability model for Al wire bonds subjected to heel crack failures
    • PII S0026271400001396
    • S. Ramminger, and N. Seliger Reliability model for Al wire bonds subjected to Heel crack failures Microelectron Reliab 40 2000 1521 1525 (Pubitemid 129662282)
    • (1999) Microelectronics Reliability , vol.40 , Issue.8-10 , pp. 1521-1525
    • Ramminger, S.1    Seliger, N.2    Wachutka, G.3
  • 4
    • 0036540853 scopus 로고    scopus 로고
    • Selected failure mechanisms of modern power modules
    • DOI 10.1016/S0026-2714(02)00042-2, PII S0026271402000422
    • M. Ciappa Selected failure mechanisms of modern power modules Microelectron Reliab 42 2002 653 667 (Pubitemid 34498209)
    • (2002) Microelectronics Reliability , vol.42 , Issue.4-5 , pp. 653-667
    • Ciappa, M.1
  • 5
    • 69249216402 scopus 로고    scopus 로고
    • Design for reliability of power electronics modules
    • H. Lu, and C. Bailey Design for reliability of power electronics modules Microelectron Reliab 49 2009 1250 1255
    • (2009) Microelectron Reliab , vol.49 , pp. 1250-1255
    • Lu, H.1    Bailey, C.2
  • 8
    • 79953647949 scopus 로고    scopus 로고
    • Investigation of the heel crack mechanism in Al connections for power electronics modules
    • Y. Celnikier, and L. Benabou Investigation of the heel crack mechanism in Al connections for power electronics modules Microelectron Reliab 51 2011 965 974
    • (2011) Microelectron Reliab , vol.51 , pp. 965-974
    • Celnikier, Y.1    Benabou, L.2
  • 10
    • 80052956708 scopus 로고    scopus 로고
    • Experimental and numerical results correlation during extreme use of power MOSFET designed for avalanche functional mode
    • L. Dupont, and J.L. Blanchard Experimental and numerical results correlation during extreme use of power MOSFET designed for avalanche functional mode Microelectron Reliab 50 2010 1804 1809
    • (2010) Microelectron Reliab , vol.50 , pp. 1804-1809
    • Dupont, L.1    Blanchard, J.L.2
  • 11
    • 34548696868 scopus 로고    scopus 로고
    • Revisiting power cycling test for better life-time prediction in traction
    • DOI 10.1016/j.microrel.2007.07.099, PII S0026271407003642
    • M. Mermet-Guyennet, and X. Perpiña Revisiting power cycling for better life-time prediction in traction Microelectron Reliab 47 2007 1690 1695 (Pubitemid 47418084)
    • (2007) Microelectronics Reliability , vol.47 , Issue.SPEC. ISS.9-11 , pp. 1690-1695
    • Mermet-Guyennet, M.1    Perpina, X.2    Piton, M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.