IGBT RBSOA non-destructive testing methods: Analysis and discussion

Microelectronics Reliability

Volumn 50, Issue 9-11, 2010, Pages 1731-1737

  Abbate, Carmine ^a   Busatto, Giovanni ^a   Iannuzzo, Francesco ^a  

^a UNIVERSITY OF CASSINO AND SOUTHERN LAZIO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORK ANALYSIS; INSULATED GATE BIPOLAR TRANSISTORS (IGBT); TESTING;

CIRCUIT OPERATION; CIRCUIT PARAMETER; EXPERIMENTAL SET UP; EXPERIMENTAL TEST; NON DESTRUCTIVE; NONDESTRUCTIVE TESTING METHOD; POWER DEVICES; PROTECTION CIRCUITS;

NONDESTRUCTIVE EXAMINATION;

EID: 80052916816     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2010.07.050     Document Type: Article

References (8)

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