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Volumn , Issue , 2000, Pages 70-76

Adhesion performance and thermo-mechanical property of epoxy-based underfill

Author keywords

Adhesives; Cobalt; Computer aided analysis; Curing; EPON; Epoxy resins; Glass; Temperature; Thermal expansion; Thermomechanical processes

Indexed keywords

ADHESION; ADHESIVES; CATALYSTS; COATINGS; COBALT; COMPUTER AIDED ANALYSIS; CURING; DIFFERENTIAL SCANNING CALORIMETRY; GLASS; GLASS TRANSITION; JOINING; MANUFACTURE; MECHANICAL PROPERTIES; PHENOLS; SILICON NITRIDE; SILICON OXIDES; TEMPERATURE; THERMAL EXPANSION;

EID: 80052871795     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ADHES.2000.860576     Document Type: Conference Paper
Times cited : (5)

References (7)
  • 2
    • 0027555077 scopus 로고
    • Effects of Adhesion and Delamination on Stress Singularities in Plastic-Packaged Integrated Circuits
    • J. C. W. van Vroonhoven, "Effects of Adhesion and Delamination on Stress Singularities in Plastic-Packaged Integrated Circuits," Journal of Electronic Packaging, Vol. 115, p.28-32, 1993.
    • (1993) Journal of Electronic Packaging , vol.115 , pp. 28-32
    • Van Vroonhoven, J.C.W.1
  • 6
    • 0031640724 scopus 로고    scopus 로고
    • Characterization of Underfill/Passivation Interfacial Adhesion for Direct Chip Attach Assemblies Using Fracture Toughness and Hydro-Thermal Fatigue Measurements
    • Charan K. Gurumurthy, Larry G. Norris, Chung-Yuen Hui, Edward J, Kramer, "Characterization of Underfill/Passivation Interfacial Adhesion for Direct Chip Attach Assemblies Using Fracture Toughness and Hydro-Thermal Fatigue Measurements", Proceeding of 48th Electronic Components and Technology Conference, p721, 1998
    • (1998) Proceeding of 48th Electronic Components and Technology Conference , pp. 721
    • Gurumurthy, C.K.1    Norris, L.G.2    Hui, C.-Y.3    Kramer, E.J.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.