Direct observation of ion-irradiation-induced chemical mixing

Journal of Nuclear Materials

Volumn 418, Issue 1-3, 2011, Pages 106-109

  Parish, C M ^a   Edmondson, P D ^a   Zhang, Y ^a   Miller, M K ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL INTERFACES; FERRITIC ALLOYS; HETEROGENEOUS INTERFACES; ION BEAM PROCESSING; NANO-STRUCTURED; NEUTRON BOMBARDMENTS; RADIATION MATERIALS; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

DEPTH PROFILING; DISSOLUTION; INTERFACES (MATERIALS); IONS; MIXING; NEUTRON IRRADIATION; RADIATION DAMAGE; TITANIUM; TRANSMISSION ELECTRON MICROSCOPY;

ION BOMBARDMENT;

EID: 80052752669     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnucmat.2011.07.035     Document Type: Article

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