Noise and optical activities of local defects in solar cells pn junctions

Proceedings of the IEEE 21st International Conference on Noise and Fluctuations, ICNF 2011

Volumn , Issue , 2011, Pages 405-408

  Koktavy, Pavel ^a   MacKu, Robert ^a  

^a BRNO UNIVERSITY OF TECHNOLOGY   (Czech Republic)

Author keywords

diagnostics; light emission; microplasma noise; pn junction; silicon; solar cell

Indexed keywords

LOCAL DEFECTS; MICROPLASMA NOISE; OPTICAL ACTIVITY; OPTICAL CHARACTERISTICS; P-N JUNCTION; PHYSICAL MECHANISM;

MONOCRYSTALLINE SILICON; OPTICAL CORRELATION; OPTICAL MATERIALS;

DEFECTS;

EID: 80052742147     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICNF.2011.5994355     Document Type: Conference Paper

References (5)

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3. P. Koktavý, R. Macků, P. Paračka, O. Krčál, "Microplasma noise as a tool for PN junctions diagnostics", WSEAS Transactions on Electronics, vol. 4, no. 9, p. 186-191, 2008.
4. R. Macků, P. Koktavý, "Analysis of fluctuation processes in forwardbiased solar cells using noise spectroscopy", Physica status solidi (a), vol. 207, no. 10, p. 2387-2394, 2010.
5. P. Škarvada, P. Tománek, L. Grmela, S. Smith, "Microscale localization of low light emitting spots in reversed-biased silicon solar cells", Solar Energy Materials and Solar Cells, vol. 94, no. 12, p. 2358-2361, 2010.