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Volumn 207, Issue 10, 2010, Pages 2387-2394

Analysis of fluctuation processes in forward-biased solar cells using noise spectroscopy

Author keywords

1 f Noise; Non destructive diagnostic; Power spectral noise density; Solar cells; Transport mechanism

Indexed keywords

1/F NOISE; ANALYSIS METHOD; CONCURRENT PROCESS; DIAGNOSTIC METHODS; FURTHER DEVELOPMENT; MANUFACTURING TECHNOLOGIES; MATHEMATICAL DESCRIPTIONS; NOISE MODELS; NOISE SIGNALS; NOISE SOURCE; NOISE SPECTROSCOPY; NON DESTRUCTIVE; NON-DESTRUCTIVE DIAGNOSTIC; POWER SPECTRAL; TRANSPORT MECHANISM; TRANSPORT PROCESS;

EID: 77957910867     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.201026206     Document Type: Article
Times cited : (31)

References (10)
  • 1
    • 84889862190 scopus 로고    scopus 로고
    • John Wiley & Sons New York ISBN 978-0-471-14323-9
    • S. M. Sze, Physics of Semiconductor Devices (John Wiley & Sons, New York, 2006), ISBN 978-0-471-14323-9.
    • (2006) Physics of Semiconductor Devices
    • Sze, S.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.