Microplasma noise as a tool for PN junctions diagnostics

WSEAS Transactions on Electronics

Volumn 4, Issue 9, 2007, Pages 186-191

  Koktavy, P ^a   Macku, R ^a   Paracka, P ^a   Krcal, O ^a  

^a BRNO UNIVERSITY OF TECHNOLOGY   (Czech Republic)

Author keywords

Avalanche breakdown; Impact ionization; Microplasma; Noise diagnostics; PN junction; Quality

Indexed keywords

ELECTRIC BREAKDOWN; ELECTRIC FIELD EFFECTS; IMPACT IONIZATION; PLASMA DIAGNOSTICS;

AVALANCHE BREAKDOWN; MICROPLASMA NOISE; PN JUNCTIONS; REVERSED BIASED JUNCTIONS;

SEMICONDUCTOR JUNCTIONS;

EID: 43249098875     PISSN: 11099445     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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