SCOPUS 정보 검색 플랫폼

Volumn 27, Issue 18, 2011, Pages 11605-11608

Comparative height measurements of dip-pen nanolithography-produced lipid membrane stacks with atomic force, fluorescence, and surface-enhanced ellipsometric contrast microscopy

(4) Hirtz, Michael a Corso, Rémi b Sekula Neuner, Sylwia a Fuchs, Harald a,c

a KARLSRUHE INSTITUTE OF TECHNOLOGY (Germany)

b Nanolane Parc des Sittelles ^* (France)

c UNIVERSITY OF MÜNSTER (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

1 ,2-DIOLEOYL-SN-GLYCERO-3-PHOSPHOCHOLINE; ACTIVE SURFACES; AFM; ATOMIC FORCE; COMBINED INFORMATIONS; COMPARATIVE STUDIES; DIP-PEN NANOLITHOGRAPHY; HEIGHT MEASUREMENT; HIGH-THROUGHPUT SCREENING; LIPID MEMBRANES; LITHOGRAPHIC STRUCTURES; MICROSCOPIC TECHNIQUES; OPTICAL METHODS; PHOSPHOLIPID MEMBRANE; STRUCTURAL MODELS; THIN MEMBRANE;

ATOMIC FORCE MICROSCOPY; ELLIPSOMETRY; FLUORESCENCE; FLUORESCENCE MICROSCOPY; MODEL STRUCTURES; PHASE SEPARATION; PHOSPHOLIPIDS;

NANOLITHOGRAPHY;

PHOSPHOLIPID;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL STRUCTURE; CHEMISTRY; COMPARATIVE STUDY; CONFORMATION; FLUORESCENCE MICROSCOPY; NANOTECHNOLOGY; PRINTING;

MICROSCOPY, ATOMIC FORCE; MICROSCOPY, FLUORESCENCE; MODELS, MOLECULAR; MOLECULAR CONFORMATION; NANOTECHNOLOGY; PHOSPHOLIPIDS; PRINTING;

EID: 80052732763 PISSN: 07437463 EISSN: 15205827 Source Type: Journal
DOI: 10.1021/la202703j Document Type: Article

Times cited : (30)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.