Surface enhanced ellipsometric contrast (SEEC) basic theory and λ/4 multilayered solutions

Optics Express

Volumn 15, Issue 13, 2007, Pages 8329-8339

  Ausserre D ^a   Valignat, M P ^b  

^a UNIVERSITÉ DU MAINE   (France)

^b AIX MARSEILLE UNIVERSITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; ELLIPSOMETRY; OPTICAL MICROSCOPY; POLARIZATION; PRODUCT DESIGN; REFRACTIVE INDEX;

CROSS POLARIZERS; FRESNEL COEFFICIENTS; SURFACE ENHANCED ELLIPSOMETRIC CONTRAST (SEEC);

MULTILAYERS;

EID: 34250802546     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.15.008329     Document Type: Article

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