Surrogate-model-based analysis of analog circuits-part I: Variability analysis

IEEE Transactions on Device and Materials Reliability

Volumn 11, Issue 3, 2011, Pages 466-473

  Yelten, Mustafa Berke ^a   Franzon, Paul D ^a   Steer, Michael B ^a  

^a North Carolina State University   (United States)

Author keywords

Analog circuits; process variations; reliability; surrogate model; variability

Indexed keywords

ANALYTIC FUNCTIONS; DESIGN PROCEDURE; MODEL EQUATIONS; PMOS DEVICES; PROCESS COMPONENT; PROCESS VARIATION; RELIABILITY ANALYSIS METHOD; RESPONSE SURFACE; SIMULATION TECHNIQUE; SINGLE TRANSISTORS; SURROGATE MODEL; TERMINAL VOLTAGES; VARIABILITY; VARIABILITY ANALYSIS;

ANALOG CIRCUITS; CIRCUIT SIMULATION; DIFFERENTIAL AMPLIFIERS; ELECTRIC NETWORK ANALYSIS; FUEL ADDITIVES; MOS DEVICES; RELIABILITY ANALYSIS;

COMPUTER SIMULATION;

EID: 80052629798     PISSN: 15304388     EISSN: 15582574     Source Type: Journal    
DOI: 10.1109/TDMR.2011.2160063     Document Type: Article

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