Kriging model combined with latin hypercube sampling for surrogate modeling of analog integrated circuit performance

Proceedings of the 10th International Symposium on Quality Electronic Design, ISQED 2009

Volumn , Issue , 2009, Pages 554-558

  Hailong, You ^a   Maofeng, Yang ^a   Dan, Wang ^a   Xinzhang, Jia ^a  

^a XIDIAN UNIVERSITY   (China)

Author keywords

Circuit performance; Design of Experiments; Kriging Model; Latin Hypercube Sampling; Parametric yield; Response Surface Model; Surrogate modeling

Indexed keywords

CIRCUIT PERFORMANCE; KRIGING MODEL; LATIN HYPERCUBE SAMPLING; PARAMETRIC YIELD; RESPONSE SURFACE MODEL; SURROGATE-MODELING;

CIRCUIT SIMULATION; DESIGN OF EXPERIMENTS; FUEL ADDITIVES; GEOMETRY; GLOBAL OPTIMIZATION; INTEGRATED CIRCUITS; LINEAR INTEGRATED CIRCUITS; MEASUREMENT ERRORS; OPERATIONAL AMPLIFIERS; RANDOM ERRORS; SAMPLING;

SURFACE PROPERTIES;

EID: 67649672456     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2009.4810354     Document Type: Conference Paper

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