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Volumn 21, Issue 37, 2011, Pages 14259-14264
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Chemical mapping and electrical conductivity of carbon nanotube patterned arrays
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Author keywords
[No Author keywords available]
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Indexed keywords
AMMONIUM CHLORIDE;
BI-LAYER;
CHEMICAL MAPPING;
DROP COATINGS;
ELECTRICAL CONDUCTIVITY;
ELECTRICAL PROBE MEASUREMENTS;
HIGH LOADINGS;
HYBRID FILM;
HYBRID STRUCTURE;
LAYER BY LAYER DEPOSITION;
MEASUREMENT TECHNIQUES;
MICRO CONTACT PRINTING;
MICRON SCALE;
PATTERNED ARRAYS;
PLANAR ARRAYS;
SI WAFER;
SURFACE PATTERN;
THIN FILM COMPOSITES;
TRIMETHOXYSILANE;
AMMONIUM COMPOUNDS;
ATOMIC FORCE MICROSCOPY;
CARBON FILMS;
CARBON NANOTUBES;
CHLORINE COMPOUNDS;
CONDUCTIVE FILMS;
ELECTRIC CONDUCTIVITY;
ELECTRON DEVICE MANUFACTURE;
RAMAN SPECTROSCOPY;
SEMICONDUCTING SILICON COMPOUNDS;
SILICON WAFERS;
THIN FILMS;
VAPOR DEPOSITION;
DEPOSITION;
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EID: 80052532233
PISSN: 09599428
EISSN: 13645501
Source Type: Journal
DOI: 10.1039/c1jm11107h Document Type: Article |
Times cited : (1)
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References (41)
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