Efficient resistive memory effect on SrTiO3 by ionic-bombardment

Applied Physics Letters

Volumn 99, Issue 9, 2011, Pages

  Gross, Heiko ^a   Oh, Seongshik ^b  

^a UNIVERSITY OF WÜRZBURG   (Germany)

^b RUTGERS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LITHOGRAPHIC PROCESS; MEMORY EFFECTS; RESISTIVE STATE; SRTIO;

OXYGEN VACANCIES; STRONTIUM ALLOYS; STRONTIUM TITANATES;

ION BOMBARDMENT;

EID: 80052526228     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3633114     Document Type: Article

References (22)

1. A. Kingon, Nature Mater. 5, 251 (2006). 10.1038/nmat1623
2. A. Sawa, Mater. Today 11, 28 (2008). 10.1016/S1369-7021(08)70119-6 (Pubitemid 351680723)
3. R. Waser and M. Aono, Nature Mater. 6, 833 (2007). 10.1038/nmat2023 (Pubitemid 350064191)
4. J. R. Jameson, Y. Fukuzumi, Z. Wang, P. Griffin, K. Tsunoda, G. I. Meijer, and Y. Nishi, Appl. Phys. Lett. 91, 112101 (2007). 10.1063/1.2769961 (Pubitemid 47415984)
5. P. Maksymovych, S. Jesse, P. Yu, R. Ramesh, A. P. Baddorf, and S. V. Kalinin, Science 324, 1421 (2009). 10.1126/science.1171200
6. A. Sawa, T. Fuji, M. Kawasaki, and Y. Tokura, Appl. Phys. Lett. 85, 4073 (2004). 10.1063/1.1812580
7. D. C. Kim, S. Seo, S. E. Ahn, D. S. Suh, M. J. Lee, B. H. Park, I. K. Yoo, I. G. Baek, H. J. Kim, E. K. Yim, J. E. Lee, S. O. Park, H. S. Kim, U. I. Chung, J. T. Moon, and B. I. Ryu, Appl. Phys. Lett. 88, 202102 (2006). 10.1063/1.2204649 (Pubitemid 43781782)
8. X. B. Yan, Y. D. Xia, H. N. Xu, X. Gao, H. T. Li, R. Li, J. Yin, and Z. G. Liu, Appl. Phys. Lett. 97, 112101 (2010). 10.1063/1.3488810
9. Y. Watanabe, J. G. Bednorz, A. Bietsch, C. Gerber, D. Widmer, A. Beck, and S. J. Wind, Appl. Phys. Lett. 78, 3738 (2001). 10.1063/1.1377617
10. D. B. Strukov, G. S. Snider, D. R. Stewart, and R. S. Williams, Nature 453, 80 (2008). 10.1038/nature06932 (Pubitemid 351630336)
11. J. Borghetti, G. S. Snider, P. J. Kuekes, J. J. Yang, D. R. Stewart, and R. S. Williams, Nature 464, 873 (2010). 10.1038/nature08940
12. O. N. Tufte and P. W. Chapman, Phys. Rev. 155, 796 (1967). 10.1103/PhysRev.155.796
13. K. v. Benthem, C. Elsasser, and R. H. French, J. Appl. Phys. 90, 6156 (2001). 10.1063/1.1415766 (Pubitemid 34046774)
14. W. Luo, W. Duan, S. G. Louie, and M. L. Cohen, Phys. Rev. B 70, 214109 (2004). 10.1103/PhysRevB.70.214109 (Pubitemid 40239446)
15. K. Szot, W. Speier, G. Bihlmayer, and R. Waser, Nature Mater. 5, 312 (2006). 10.1038/nmat1614
16. D. Kan, O. Sakata, S. Kimura, M. Takano, and Y. Shimakawa, Jpn. J. Appl. Phys. 46, L471 (2007). 10.1143/JJAP.46.L471 (Pubitemid 47252386)
17. D. W. Reagor and V. Y. Butko, Nature Mater. 4, 593 (2005). 10.1038/nmat1402 (Pubitemid 41092687)
18. D. Kan, T. Terashima, R. Kanda, A. Masuno, K. Tanaka, S. Chu, H. Kan, A. Ishizumi, Y. Kanemitsu, Y. Shimakawa, and M. Takano, Nature Mater. 4, 816 (2005). 10.1038/nmat1498
19. H. Gross, N. Bansal, Y.-S. Kim, and S. Oh, e-print arXiv:1104.5522.
20. H. Gross, M.S. thesis (Rutgers, The State University of New Jersey, 2009).
21. H. Y. Hwang, Nature Mater. 4, 803 (2005). 10.1038/nmat1515
22. D. D. Cuong, B. Lee, K. M. Choi, H.-S. Ahn, S. Han, and J. Lee, Phys. Rev. Lett. 98, 115503 (2007). 10.1103/PhysRevLett.98.115503 (Pubitemid 46434393)