Dynamic junction temperature measurement for high power light emitting diodes

Review of Scientific Instruments

Volumn 82, Issue 8, 2011, Pages

  Chen, Quan ^a,b   Luo, Xiaobing ^a,c   Zhou, Shengjun ^c,d   Liu, Sheng ^a,c  

^a HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^b ZUNYI NORMAL COLLEGE   (China)

^c HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^d SHANGHAI JIAO TONG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EXPERIMENTAL DATA; FAST SWITCHES; HIGH POWER LIGHT EMITTING DIODES; INSTRUMENT CALIBRATIONS; JUNCTION TEMPERATURES; MEASUREMENT ACCURACY; REFERENCE VALUES; SOLID STATE LIGHTING; STANDARD ERRORS;

CALIBRATION; EXPERIMENTS; LIGHT EMISSION; LIGHTING; MEASUREMENT ERRORS; TEMPERATURE MEASUREMENT;

LIGHT EMITTING DIODES;

EID: 80052399874     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3624699     Document Type: Article

References (12)

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