Optical scattering properties of a nano-textured ZnO-silicon interface

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8001, Issue , 2011, Pages

  Jager K ^a   Schulte, M ^b   Bittkau, K ^b   Ermes, A M ^b   Zeman, M ^a   Pieters, B E ^b  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

FDTD; microcrystalline silicon; ray tracing; scalar scattering theory; scattering; surface textured TCO; ZnO

Indexed keywords

APPROXIMATE MODEL; EXPERIMENTAL TECHNIQUES; FDTD; MAXWELL'S EQUATIONS; MEASURED RESULTS; NUMERICAL SOLUTION; OPTICAL SCATTERING; RIGOROUS DIFFRACTION THEORY; SCALAR SCATTERING; SCATTERING PROPERTY; SURFACE-TEXTURED TCO; THIN-FILM SILICON SOLAR CELLS; TRANSPARENT CONDUCTIVE OXIDES; ZNO;

DIFFRACTION; DIFFRACTION GRATINGS; LIGHT SCATTERING; MAXWELL EQUATIONS; MICROCRYSTALLINE SILICON; OPTICAL PROPERTIES; OPTICS; PHOTONICS; SEMICONDUCTING SILICON COMPOUNDS; ZINC OXIDE;

SCATTERING;

EID: 80052319982     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.889943     Document Type: Conference Paper

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