Scalar scattering model of highly textured transparent conducting oxide

Journal of Applied Physics

Volumn 109, Issue 1, 2011, Pages

  Lin, Chien Chung ^a   Liu, Wei Lin ^a   Hsieh, Chi Ying ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL FORMULATION; CELL STRUCTURE; COMPLEX SURFACE; CORRELATION LENGTHS; CRITICAL FACTORS; ENERGY SOLUTIONS; HEIGHT DISTRIBUTION; KIRCHHOFF APPROXIMATIONS; LIGHT-TRAPPING; NEAR-IR; PHYSICAL FACTORS; PROCESS EVALUATION; SCALAR SCATTERING; TRANSPARENT CONDUCTING OXIDE;

AMORPHOUS SILICON; CONVERSION EFFICIENCY; ENERGY CONVERSION; SOLAR ENERGY; SURFACE ROUGHNESS;

SCATTERING;

EID: 78751562150     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3530684     Document Type: Article

References (31)

1. P. Campbell and M. A. Green, J. Appl. Phys. 62, 243 (1987).
2. M. Kambe, A. Takahashi, N. Taneda, K. Masumo, T. Oyama, and K. Sato, 33rd IEEE Photovoltaic Specialists Conference, San Diego, CA, 11-16 May 2008, pp. 1-4.
3. N.-N. Feng, J. Michel, L. Zeng, J. Liu, C.-Y. Hong, L. C. Kimerling, and X. Duan, IEEE Trans. Electron Devices 54, 1926 (2007).
4. A. Hongsingthong, T. Krajangsang, I. A. Yunaz, S. Miyajima, and M. Konagai, Appl. Phys. Express 3, 051102 (2010).
5. J. Krc, B. Lipovsek, M. Bokalic, A. Campa, T. Oyama, M. Kambe, T. Matsui, H. Sai, M. Kondo, and M. Topi, Thin Solid Films 518, 3054 (2010).
6. G. Yue, L. Sivec, J. M. Owens, B. Yan, J. Yang, and S. Guha, Appl. Phys. Lett. 95, 263501 (2009).
7. H. Davies, Proc. IEEE 101, 209 (1954).
8. J. O. Porteus, J. Opt. Soc. Am. 53, 1394 (1963).
9. P. Beckmann and A. Spizzichino, The Scattering of Electromagnetic Waves from Rough Surfaces (Pergamon, Oxford, 1963).
10. K. Jaeger and M. Zeman, Optics for Solar Energy, OSA Technical Digest (Optical Society of America, New York, 2010).
11. D. Dominé, F.-J. Haug, C. Battaglia, and C. Ballif, J. Appl. Phys. 107, 044504 (2010).
12. M. Zeman, R. A. C. M. M. van Swaaij, J. W. Metselaar, and R. E. I. Schropp, J. Appl. Phys. 88, 6436 (2000).
13. I. Simonsen, A. Larsen, E. Andreassen, E. Ommundsen, and K. Nord-Varhaug, Phys. Rev. A 79, 063813 (2009).
14. H. Ragheba and E. R. Hancock, Pattern Recogn. 40, 2004 (2007).
15. E. Marx and T. V. Vorburger, Appl. Opt. 29, 3613 (1990).
16. J. Caron, J. Lafait, and C. Andraud, Opt. Commun. 207, 17 (2002).
17. J. A. Sánchez-Gil and M. Nieto-Vesperinas, J. Opt. Soc. Am. A 8, 1270 (1991).
18. P. B. Nagy and L. Adler, J. Acoust. Soc. Am. 82, 193 (1987).
19. H. P. Pillai, J. Krc, and M. Zeman, Proceedings of Semiconductor Advances for Future Electronics, Veldhoven, The Netherlands, 28-30 November 2001, pp.159-162.
20. D. Dominé, P. Buehlmann, J. Bailat, A. Billet, A. Feltrin, and C. Ballif, Phys. Status Solidi (RRL) 2, 163 (2008).
21. N. Taneda, K. MASUMO, M. Kambe, T. Oyama, and K. Sato, 23rd European Photovoltaic Solar Energy Conference, Valencia, Spain, 1-5 September 2008, pp. 2084-2087.
22. C. Cording, International Workshop on Glass for Harvesting, Storage and Efficient usage of Solar Energy, Pittsburgh, PA, 16-18 November 2008, Technical Session II.
23. J. Krc, M. Zeman, O. Kluth, F. Smole, and M. Topic, Thin Solid Films 426, 296 (2003).
24. J. Krě, M. Zeman, O. Kluth, F. Smole, and M. Topic, J. Appl. Phys. 92, 749 (2002).
25. H. E. Bennett, J. Opt. Soc. Am. 53, 1389 (1963).
26. M. Nieto-Vesperinas, J. A. Sánchez-Gil, A. J. Sant, and J. C. Dainty, Opt. Lett. 15, 1261 (1990).
27. A. E. Rakhshani, Y. Makdisi, and H. A. Ramazaniyan, J. Appl. Phys. 83, 1049 (1998).
28. J. M. Bennett and L. Mattsson, Introduction to Surface Roughness and Scattering (Optical Society of America, Washington, DC, 1989), Chap. 5, pp. 57-68.
29. J. M. Soto-Crespo and M. Nieto-Vesperinas, J. Opt. Soc. Am. A 6, 367 (1989).
30. E. I. Thorsos, J. Acoust. Soc. Am. 83, 78 (1988).
31. M. Nieto-Vesperinas, Scattering and Diffraction in Physical Optics (Wiley, New York, 1991), Chap. 7.