An automated directional reflectance/transmittance analyser for coating analysis

Thin Solid Films

Volumn 442, Issue 1-2, 2003, Pages 74-79

  Van Nijnatten, P A ^a  

^a TNO   (Netherlands)

Author keywords

Coatings; Optical spectroscopy; Reflectance and transmittance

Indexed keywords

LIGHT REFLECTION; LIGHT TRANSMISSION; REFLECTOMETERS; SPECTROPHOTOMETERS;

COATING ANALYSIS;

OPTICAL COATINGS;

EID: 0141859835     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(03)00947-7     Document Type: Conference Paper

References (12)

1. P.A. van Nijnatten, Ph.D. Thesis, Oxford Brookes University, 2002.
2. P.A. van Nijnatten, Renewable Energy, Proceedings of World Renewable Energy Congress VI, A. Sayigh (Ed.), 2002.
3. A. Roos, J. Chevalier, F. Olive, Conference proceedings Window Innovations '95, Toronto, Canada, 1995, pp. 72-80.
4. Nostel P., Roos A., Rönnow D. Rev. Sc. Instr. 70:(5):1999;1-14.
5. M.G. Hutchins, A.J. Topping, in: A. Sayigh (Ed.), Proceedings of World Renewable Energy Congress VI, 2000, pp. 265-270.
6. Hutchins M.G., Topping A.J., Anderson C., Olive F., van Nijnatten P.A., Polato P., Roos A., Rubin M. Thin Solid Films. 392:2001;269-275.
7. P.A. van Nijnatten, Proceedings of the 6th International Conference on Architectural and Automotive Glass, Today and in the 21st Century, Glass Processing Days, Tampere (Finland), June 13-16, 1999.
8. P.A. van Nijnatten, Proceedings of the International Symposium on Optical Materials Technology for Solar Energy Conversion XI, Europto Series Vol. 1727, 1992, pp. 223-233.
9. Ward L. The Optical Constants of Bulk Materials and Films. 1988;Adam Hilger, Bristol and Philadelphia.
10. Arndt D.R., Azzam R.M.A., Bennet J.M., Borgogno J.P., Carniglia C.K., Case W.E., Dobrowolski J.A., Gibson U.J., Tuttle Hart T., Ho F.C., Hodgkin V.A., Klapp W.P., Macleod H.A., Pelletier E., Purvis M.K., Quinn D.M., Strome D.H., Swenson R., Temple P.A., Thonn T.F. Appl. Opt. 23:1984;3571-3596.
11. J.A. Woollam, B.J. Craig, M. Herzinger, J.N. Hilfiker, R. Synowicki, C. Bungay, Overview of Variable Angle Spectroscopic Ellipsometry (VASE), Part I: Basic Theory and Typical Applications, SPIE Proceedings, CR72, 1999.
12. W. Theiss, CODE: Optical spectrum analysis and prediction for research, design and production control of multilayer coatings, Proceedings of the 3rd ICCG, Universal Press, 2000, pp. 525-543.