Ray tracing for the optics at nano-textured ZnO-Air and ZnO-Silicon interfaces

Progress in Photovoltaics: Research and Applications

Volumn 19, Issue 6, 2011, Pages 724-732

  Schulte, Melanie ^a   Bittkau, Karsten ^a   Pieters, Bart Elger ^a   Jorke, Silvia ^a   Stiebig, Helmut ^b   Hüpkes, Jürgen ^a   Rau, Uwe ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b Malibu GmbH and Co KG   (Germany)

Author keywords

Chandezon; Interface; Light scattering; Light trapping; Ray tracing; SNOM; TCO; ZnO

Indexed keywords

CHANDEZON; GEOMETRIC OPTICS; INTERFACE TOPOGRAPHY; LIGHT TRAPPING; LOCAL SCATTERING; MAXWELL'S EQUATIONS; MICRO LENS; NUMERICAL SOLUTION; RAY-TRACING MODEL; SCANNING NEAR-FIELD OPTICAL MICROSCOPY; SCATTERED INTENSITY; TCO; THIN-FILM SILICON SOLAR CELLS; ZNO;

LIGHT; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICS; RAY TRACING; SCATTERING; SEMICONDUCTING SILICON COMPOUNDS; ZINC OXIDE;

MAXWELL EQUATIONS;

EID: 80052313366     PISSN: 10627995     EISSN: 1099159X     Source Type: Journal    
DOI: 10.1002/pip.1097     Document Type: Article

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