Quantitative nanoscopic impedance measurements on silver-ion conducting glasses using atomic force microscopy combined with impedance spectroscopy

Solid State Ionics

Volumn 198, Issue 1, 2011, Pages 16-21

  Kruempelmann, J ^a   Balabajew, M ^a   Gellert, M ^a   Roling, B ^a  

^a PHILIPPS UNIVERSITY MARBURG   (Germany)

Author keywords

Cyclic voltammetry; Ionic conduction; Nanoscopic impedance; Silver nanoparticles; Spreading resistance

Indexed keywords

AC VOLTAGE; ATOMIC FORCE MICROSCOPES; CONDUCTING AFM; CONDUCTING GLASS; GLASS SURFACES; HALF CYCLE; IMPEDANCE MEASUREMENT; IMPEDANCE SPECTROMETER; IMPEDANCE SPECTROSCOPY; INTERFACIAL IMPEDANCE; MACROSCOPIC CONDUCTIVITY; MEAN VALUES; NANO-ELECTRODES; NANOSCOPIC IMPEDANCE; PARTICLE GROWTH; SILVER IONS; SILVER NANOPARTICLES; SILVER PARTICLES; SPREADING RESISTANCE;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; CYCLIC VOLTAMMETRY; ELECTRIC FIELDS; ELECTRIC IMPEDANCE MEASUREMENT; GLASS; METAL IONS; NANOPARTICLES; SPECTROMETERS;

SILVER;

EID: 80052262790     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssi.2011.07.008     Document Type: Article

References (13)

1. M. Drüschler, B. Huber, S. Passerini, and B. Roling J. Phys. Chem. C 114 8 2010 3614
2. J. Kruempelmann, C.R. Mariappan, C. Schober, and B. Roling Phys. Rev. B 82 22 2010 224203
3. A.A. Piarristeguy, M. Ramonda, N. Frolet, M. Ribes, and A. Pradel Solid State Ionics 181 25-26 2010 1205
4. A.J. Bhattacharyya, J. Fleig, Y.G. Guo, and J. Maier Adv. Mater. 17 21 2005 2630
5. A. Layson, S. Gadad, and D. Teeters Electrochim. Acta 48 14-16 2003 2207
6. A.R. Layson, and D. Teeters Solid State Ionics 175 1-4 2004 773
7. R. O'Hayre, G. Feng, W.D. Nix, and F.B. Prinz J. Appl. Phys. 96 6 2004 3540
8. J. Fleig, and J. Maier Solid State Ionics 85 1-4 1996 9
9. J. Fleig, S. Rodewald, and J. Maier Solid State Ionics 136-137 2000 905
10. R. O'Hayre, M. Lee, and F.B. Prinz J. Appl. Phys. 95 12 2004 8382
11. G. Taillades, N. Benjelloun, J. Sarradin, and M. Ribes Solid State Ionics 152-153 2002 119
12. W. Xianming, T. Nishina, and I. Uchida J. Power Sources 104 1 2002 90
13. M. Lee, R. O'Hayre, F.B. Prinz, and T.M. Gur Appl. Phys. Lett. 85 16 2004 3552