메뉴 건너뛰기




Volumn 181, Issue 25-26, 2010, Pages 1205-1208

High resolution electrical characterisation of Ag-conducting heterogeneous chalcogenide glasses

Author keywords

Ag chalcogenide glasses; Conductivity; Near field microscopy; Phase separation

Indexed keywords

AFM; CHALCOGENIDE GLASS; CONDUCTIVE-ATOMIC FORCE; CONDUCTIVITY; ELECTRICAL CHARACTERISATION; ELECTRICAL CHARACTERIZATION; GLASS COMPOSITIONS; HIGH RESOLUTION; NANO SCALE; NEAR FIELD MICROSCOPY; RELATIVE PERMITTIVITY; RICH PHASE; SILVER CONTENT;

EID: 77955550036     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssi.2010.06.050     Document Type: Article
Times cited : (16)

References (23)
  • 15
    • 77955554945 scopus 로고    scopus 로고
    • US Patent App. 11/276,097
    • M. Kozicki, M. Mitkova, US Patent App. 11/276,097 (2006).
    • (2006)
    • Kozicki, M.1    Mitkova, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.