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Volumn 181, Issue 25-26, 2010, Pages 1205-1208
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High resolution electrical characterisation of Ag-conducting heterogeneous chalcogenide glasses
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Author keywords
Ag chalcogenide glasses; Conductivity; Near field microscopy; Phase separation
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Indexed keywords
AFM;
CHALCOGENIDE GLASS;
CONDUCTIVE-ATOMIC FORCE;
CONDUCTIVITY;
ELECTRICAL CHARACTERISATION;
ELECTRICAL CHARACTERIZATION;
GLASS COMPOSITIONS;
HIGH RESOLUTION;
NANO SCALE;
NEAR FIELD MICROSCOPY;
RELATIVE PERMITTIVITY;
RICH PHASE;
SILVER CONTENT;
ATOMIC FORCE MICROSCOPY;
GERMANIUM;
GLASS;
PHASE MODULATION;
PHASE SEPARATION;
SCANNING ELECTRON MICROSCOPY;
SENSITIVITY ANALYSIS;
SILVER;
ELECTRIC FORCE MICROSCOPY;
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EID: 77955550036
PISSN: 01672738
EISSN: None
Source Type: Journal
DOI: 10.1016/j.ssi.2010.06.050 Document Type: Article |
Times cited : (16)
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References (23)
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