Thickness determination of graphene on metal substrate by reflection spectroscopy

Optics Express

Volumn 19, Issue 18, 2011, Pages 17226-17231

  Kaplas, Tommi ^a   Zolotukhin, Aleksey ^a   Svirko, Yuri ^a  

^a UNIVERSITY OF EASTERN FINLAND   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

REFLECTION; REFRACTIVE INDEX; SUBSTRATES; THICKNESS MEASUREMENT;

ABSORBANCES; COPPER SUBSTRATES; HIGH REFRACTIVE INDEX CONTRASTS; METAL SUBSTRATE; MULTI-LAYERED; REFLECTION SPECTROSCOPY; REFLECTIVITY MEASUREMENTS; THICKNESS DETERMINATION;

GRAPHENE;

EID: 80052199048     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.19.017226     Document Type: Article

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