Growth and characterization of Bi2Se3 thin films by pulsed laser deposition using alloy target

Thin Solid Films

Volumn 519, Issue 22, 2011, Pages 7627-7631

  Meng, Lijian ^a,b   Meng, Hui ^c   Gong, Wenjie ^c   Liu, Wei ^c   Zhang, Zhidong ^c  

^a INSTITUTO SUPERIOR DE ENGENHARIA DO PORTO   (Portugal)

^b UNIVERSITY OF MINHO   (Portugal)

^c INSTITUTE OF METAL RESEARCH   (China)

Author keywords

Bismuth selenide; Crystal microstructure; Electrical properties and measurements; Pulsed laser deposition; Scanning electron microscopy; Surface morphology; Thin films; X ray diffraction

Indexed keywords

ALLOY TARGET; BISMUTH SELENIDE; CHEMICAL STATE; CRYSTAL PHASE; CRYSTALLINITIES; DIFFERENT SUBSTRATES; ELECTRICAL PROPERTIES AND MEASUREMENTS; ELECTRICAL RESISTIVITY; HEXAGONAL STRUCTURES; ORTHORHOMBIC PHASE; POLYCRYSTALLINE STRUCTURE; PULSED-LASER DEPOSITION TECHNIQUE; RHOMBOHEDRAL PHASE; ROOM TEMPERATURE; SCANNING ELECTRONS; SI SUBSTRATES; STRUCTURAL AND ELECTRICAL PROPERTIES; SUBSTRATE TEMPERATURE; X RAY PHOTOELECTRON SPECTRA;

BISMUTH; CERIUM ALLOYS; CRYSTAL MICROSTRUCTURE; DEPOSITION; ELECTRIC CONDUCTIVITY; PHOTOELECTRON SPECTROSCOPY; PULSED LASER DEPOSITION; PULSED LASERS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING SELENIUM COMPOUNDS; STOICHIOMETRY; SUBSTRATES; SURFACE ROUGHNESS; THIN FILMS; VAPOR DEPOSITION; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

FILM PREPARATION;

EID: 80052128737     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2011.04.239     Document Type: Article

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