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Volumn 82, Issue 15, 2010, Pages

Anomalous transport in an n -type topological insulator ultrathin Bi 2 Se3 film

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EID: 78149269260     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.82.155309     Document Type: Article
Times cited : (51)

References (25)
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    • At low temperature, the carrier mean-free path may be determined by the film thickness, which may have influence on the measured mobility. However, such surface/interface scattering as well as impurity/defect scattering should not show significant temperature dependence and cannot be the sole reason for the nonmetallic temperature dependence.
    • At low temperature, the carrier mean-free path may be determined by the film thickness, which may have influence on the measured mobility. However, such surface/interface scattering as well as impurity/defect scattering should not show significant temperature dependence and cannot be the sole reason for the nonmetallic temperature dependence.


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