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Volumn 8, Issue , 2011, Pages 467-472

Laser ablation of silicon dioxide on silicon using femtosecond near infrared laser pulses

Author keywords

Silicon; Threshold; Ultra short laser ablation

Indexed keywords

ABLATION; INFRARED DEVICES; INFRARED LASERS; LASER PULSES; SILICON; SILICON OXIDES; SILICON WAFERS; ULTRASHORT PULSES;

EID: 80052100056     PISSN: 18766102     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1016/j.egypro.2011.06.167     Document Type: Conference Paper
Times cited : (14)

References (6)
  • 1
    • 79956150994 scopus 로고    scopus 로고
    • Laser processing of thin films for photovoltaic applications
    • Schoonderbeek A, Schütz V, Haupt O, Stute U. Laser processing of thin films for photovoltaic applications. JLMN 2010;5:248-255.
    • (2010) JLMN , vol.5 , pp. 248-255
    • Schoonderbeek, A.1    Schütz, V.2    Haupt, O.3    Stute, U.4
  • 6
    • 84975633474 scopus 로고
    • Simple technique for measurement of pulsed gaussian-beam spot sizes
    • Liu J.M. Simple technique for measurement of pulsed gaussian-beam spot sizes. Opt. Lett. 1982;7:196-198.
    • (1982) Opt. Lett. , vol.7 , pp. 196-198
    • Liu, J.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.