FLIM and FCS detection in laser-scanning microscopes: Increased efficiency by GaAsP hybrid detectors

Microscopy Research and Technique

Volumn 74, Issue 9, 2011, Pages 804-811

  Becker, W ^a   Su, B ^a   Holub, O ^b   weisshart, K ^b  

^a BECKER AND HICKL GMBH   (Germany)

^b CARL ZEISS SMT AG   (Germany)

Author keywords

Confocal microscopy; FCS; FLIM; Hybrid detector; Multiphoton microscopy

Indexed keywords

GALLIUM ALLOYS; III-V SEMICONDUCTORS; SEMICONDUCTOR ALLOYS; SIGNAL TO NOISE RATIO;

ACTIVE AREA; AFTERPULSING; FCS; FLIM; FLUORESCENCE LIFETIMES; HYBRID DETECTORS; LASER SCANNING MICROSCOPE; MULTIPHOTON MICROSCOPY; PHOTON COUNTING DETECTORS; TEMPORAL RESPONSE;

QUANTUM EFFICIENCY;

EID: 80051979063     PISSN: 1059910X     EISSN: 10970029     Source Type: Journal    
DOI: 10.1002/jemt.20959     Document Type: Article

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