A study on the graphene incorporated direct-patternable SnO 2 thin film

Physica Status Solidi (A) Applications and Materials Science

Volumn 208, Issue 8, 2011, Pages 1869-1872

  Kim, Hyuncheol ^a   Yun, Min Kyung ^a   Park, Hyung Ho ^a  

^a Yonsei University   (South Korea)

Author keywords

direct patterning; graphene; SnO 2 thin films; transparent conducting oxide

Indexed keywords

CRYSTALLINITIES; DIRECT-PATTERNING; ELECTRICAL PROPERTY; ETCHING PROCESS; LOW COSTS; MICROPATTERNED; NATURE OF SURFACE; SNO 2 THIN FILMS; SOLUTION DEPOSITION; TRANSPARENT CONDUCTING OXIDE;

DEPOSITION; ELECTRIC PROPERTIES; PHOTORESISTS; THIN FILMS; VAPOR DEPOSITION;

GRAPHENE;

EID: 80051681888     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.201026770     Document Type: Article

References (24)

1. T. Minami, Semicond. Sci. Technol. 20, S35 (2005).
2. D. Lee, W. K. Bae, I. Park, D. Y. Yoon, S. Lee, and, C. Lee, Sol. Energy Mater. Sol. Cells 95, 365 (2011).
3. A. S. A. C. Diniz, Renew. Energy 36, 1153 (2011).
4. D. W. Kang, S. H. Kuk, K. S. Ji, H. M. Lee, and, M. K. Han, Sol. Energy Mater. Sol. Cells 95, 138 (2011).
5. H. Kim, J. S. Horowitz, W. H. Kim, A. J. Makinen, Z. H. Kafafi, and, D. B. Chrisey, Thin Solid Films 420, 539 (2002).
6. T. Minami, H. Nanto, and, S. Takata, Jpn. J. Appl. Phys. 23, L280 (1984).
7. A. Hongsingthong, I. A. Yunaz, S. Miyajima, and, M. Konagai, Sol. Energy Mater. Sol. Cells 95, 171 (2011).
8. A. Tiburcio-Silver, and, A. Sanchez-Juarez, Mater. Sci. Eng. B 110, 268 (2004).
9. M. Gao, and, R. H. Hill, J. Mater. Res. 13, 1379 (1998).
10. H. Kim, S. J. Wang, H. H. Park, H. J. Chang, H. Jeon, and, R. H. Hill, Thin Solid Films 516, 198 (2007).
11. K. I. Bolotin, K. J. Sikes, Z. Jiang, M. Klima, G. Fudenberg, J. Hone, P. Kim, and, H. L. Stormer, Solid State Commun. 146, 351 (2008).
12. N. Park, B. K. Kim, J. O. Lee, and, J. J. Kim, Appl. Phys. Lett. 95, 243105 (2005).
13. H. Zengin, W. Zhou, J. Jin, R. Czerw, D. W. Smith, L. Echegoyen, D. L. Carroll, S. H. Foulger, and, J. Ballato, Adv. Mater. 14, 1480 (2002).
14. E. M. Levin, C. R. Robbins, and, H. F. McMurdie, Phase Diagrams for Ceramists, Vol. 4 (The American Ceramic Society, Columbus, 1981), p. 10.
15. Joint Committee for Powder Diffraction Studies (JCPDS), No. 70-4177.
16. V. C. Tung, L. M. Chen, M. J. Allen, J. K. Wassei, K. Nelson, R. B. Kaner, and, Y. Yang, Nano Lett. 9, 1949 (2009).
17. J. Robertson, and, E. P. O'Reilly, Phys. Rev. B 35, 2946 (1987).
18. J. Robertson, Mater. Sci. Eng. R 37, 129 (2002).
19. E. Fortunato, L. Raniero, L. Silva, A. Gonßalves, A. Pimentel, P. Barquinha, H. ßguas, L. Pereira, G. Gonßalves, I. Ferreira, E. Elangovan, and, R. Martins, Sol. Energy Mater. Sol. Cells 92, 1605 (2008).
20. S. Stankovich, D. A. Dikin, G. H. B. Dommett, K. M. Kohlhaas, E. J. Zimney, E. A. Stach, R. D. Piner, S. T. Nguyen, and, R. S. Ruoff, Nature 442, 282 (2006).
21. J. Chastain, Handbook of X-ray Photoelectron Spectroscopy (Perkin-Elmer Co., Physical Electronics Division, Minnesota, 1992), p. 40.
22. J. B. Hudson, Surface Science: An Introduction (Butterworth-Heinemann, Stoneham, 1992), p. 38.
23. Y. Tang, and, J. Gou, Mater. Lett. 64, 2513 (2010).
24. D. A. Neamen, Semiconductor Physics and Devices: Basic Principles (McGraw-Hill, New York, 2003), p. 103.