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Volumn 99, Issue 5, 2011, Pages

Effects of ferroelectric dead layer on the electron transport in ferroelectric tunneling junctions

Author keywords

[No Author keywords available]

Indexed keywords

ALTERNATIVE ROUTES; DEAD LAYERS; ELECTRON TRANSPORT; ELECTRORESISTANCE; LOW DIELECTRIC CONSTANTS; NANOSCALE DEVICE; TUNNELING JUNCTIONS;

EID: 80051583975     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3619841     Document Type: Article
Times cited : (34)

References (15)
  • 1
    • 33746013199 scopus 로고    scopus 로고
    • Tunneling across a ferroelectric
    • DOI 10.1126/science.1126230
    • E. Y. Tsymbal and H. Kohlstedt, Science 313, 181 (2006). 10.1126/science.1126230 (Pubitemid 44066239)
    • (2006) Science , vol.313 , Issue.5784 , pp. 181-183
    • Tsymbal, E.Y.1    Kohlstedt, H.2
  • 8
    • 33749850301 scopus 로고    scopus 로고
    • Origin of the dielectric dead layer in nanoscale capacitors
    • DOI 10.1038/nature05148, PII NATURE05148
    • M. Stengel and N. A. Spaldin, Nature 443, 679 (2006). 10.1038/nature05148 (Pubitemid 44564708)
    • (2006) Nature , vol.443 , Issue.7112 , pp. 679-682
    • Stengel, M.1    Spaldin, N.A.2
  • 10
    • 78149259514 scopus 로고    scopus 로고
    • 10.1103/PhysRevB.82.155304
    • W. A. Al-Saidi and A. M. Rappe, Phys. Rev. B 82, 155304 (2010). 10.1103/PhysRevB.82.155304
    • (2010) Phys. Rev. B , vol.82 , pp. 155304
    • Al-Saidi, W.A.1    Rappe, A.M.2
  • 14
    • 52349120545 scopus 로고    scopus 로고
    • 10.1063/1.2976780
    • J. Wang and Z. Y. Li, Appl. Phys. Lett. 93, 112501 (2008). 10.1063/1.2976780
    • (2008) Appl. Phys. Lett. , vol.93 , pp. 112501
    • Wang, J.1    Li, Z.Y.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.