SCOPUS 정보 검색 플랫폼

Optics Communications

Volumn 284, Issue 19, 2011, Pages 4356-4359

THz wave polarization-controlled spectroscopic imaging for anisotropic materials

(5) Zhang, Liangliang a Zhong, Hua b Deng, Chao a Zhang, Cunlin a Zhao, Yuejin c

a CAPITAL NORMAL UNIVERSITY (China)

b PEKING UNIVERSITY (China)

c BEIJING INSTITUTE OF TECHNOLOGY (China)

Author keywords

Image forming and processing; Nondestructive inspection; Polarization

Indexed keywords

AIR PLASMAS; ANISOTROPIC MATERIAL; AZIMUTHAL ANGLE; ELECTRIC-FIELD AMPLITUDE; HIGHLY SENSITIVE; IMAGE FORMING AND PROCESSING; INCIDENT WAVES; LASER INDUCED; NON DESTRUCTIVE INSPECTION; POLARIZATION RESPONSE; RELATIVE PHASE; SECOND HARMONIC WAVES; SPECTROSCOPIC IMAGING; THZ GENERATION; THZ WAVES; TWO-COLOR;

ANISOTROPY; CHARACTERIZATION; ELECTRIC FIELD EFFECTS; IMAGING TECHNIQUES; POLARIZATION; TERAHERTZ WAVES; VISCOSITY MEASUREMENT;

TERAHERTZ WAVE DETECTORS;

EID: 80051548500 PISSN: 00304018 EISSN: None Source Type: Journal
DOI: 10.1016/j.optcom.2011.05.036 Document Type: Article

Times cited : (13)

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