Nondestructive defect identification with terahertz time-of-flight tomography

IEEE Sensors Journal

Volumn 5, Issue 2, 2005, Pages 203-207

  Zhong, Hua ^a   Xu, Jingzhou ^b   Xie, Xu ^b   Yuan, Tao ^a   Reightler, Ron ^c   Madaras, Eric ^b,d   Zhang, Xi Cheng ^b  

^a RENSSELAER POLYTECHNIC INSTITUTE   (United States)

^b RENSSELAER POLYTECHNIC INSTITUTE   (United States)

^c LOCKHEED MARTIN   (United States)

^d NASA LANGLEY RESEARCH CENTER   (United States)

Author keywords

Nondestructive identification; Terahertz (THz) imaging; THz technology; THz time domain spectroscopy; Time of flight (TOF); Tomography

Indexed keywords

AIRCRAFT FUEL TANKS; AMPLITUDE MODULATION; ANTENNAS; CRYSTALS; DEFECTS; ELECTROOPTICAL EFFECTS; MATHEMATICAL MODELS; NONDESTRUCTIVE EXAMINATION; SIGNAL TO NOISE RATIO; SPECTROSCOPIC ANALYSIS; TOMOGRAPHY; WAVEFORM ANALYSIS;

NONDESTRUCTIVE IDENTIFICATION; TERAHERTZ (THZ) IMAGING; THZ TECHNOLOGY; THZ TIME DOMAIN SPECTROSCOPY; TIME OF FLIGHT (TOF);

IMAGING TECHNIQUES;

EID: 16444381428     PISSN: 1530437X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSEN.2004.841341     Document Type: Article

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