Terahertz polarization imaging

Optics Letters

Volumn 30, Issue 20, 2005, Pages 2802-2804

  van der Valk, Nick C J ^a   van der Marel, Willemine A M ^a   Planken, Paul C M ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC-FIELD VECTORS; ELECTRO-OPTICAL SAMPLING; POLARIZATION STATE; TERAHERTZ PULSES;

ELECTRIC FIELD EFFECTS; ELECTROOPTICAL EFFECTS; LASER PULSES; LIGHT POLARIZATION; POLYSTYRENES; SPECTROSCOPIC ANALYSIS; VECTORS;

IMAGING TECHNIQUES;

DIAGNOSTIC AGENT;

ARTICLE; ELECTROMAGNETIC FIELD; IMAGE ENHANCEMENT; INFRARED RADIATION; METHODOLOGY; MICROWAVE RADIATION; POLARIZATION MICROSCOPY;

ELECTROMAGNETIC FIELDS; IMAGE ENHANCEMENT; INFRARED RAYS; MICROSCOPY, POLARIZATION; MICROWAVES;

EID: 27744507288     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.30.002802     Document Type: Article

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