High-resolution electrical detection of free induction decay and Hahn echoes in phosphorus-doped silicon

Physical Review B - Condensed Matter and Materials Physics

Volumn 83, Issue 23, 2011, Pages

  Lu, Jinming ^a,c   Hoehne, Felix ^a   Stegner, Andre R ^a   Dreher, Lukas ^a   Stutzmann, Martin ^a   Brandt, Martin S ^a   Huebl, Hans ^b  

^a WALTER SCHOTTKY INSTITUT   (Germany)

^b WALTHER MEISSNER INSTITUT   (Germany)

^c TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 79961189576     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.83.235201     Document Type: Article

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