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Review of Scientific Instruments

Volumn 82, Issue 7, 2011, Pages

A scanning probe-based pick-and-place procedure for assembly of integrated quantum optical hybrid devices

(6) Schell, Andreas W a Kewes, Günter a Schröder, Tim a Wolters, Janik a Aichele, Thomas a Benson, Oliver a

a HUMBOLDT UNIVERSITY (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; CONFOCAL SETUP; CONTROLLED DEPOSITION; FABRICATION METHOD; NANO-DIAMONDS; NITROGEN-VACANCY CENTER; OPTICAL EXPERIMENTS; OPTICAL HYBRIDS; OPTICAL RESPONSE; PHOTONIC NANOSTRUCTURES; PICK-AND-PLACE; PROBE-BASED; SINGLE EMITTER; SINGLE PHOTONS;

ATOMIC FORCE MICROSCOPY;

NANOPARTICLES;

EID: 79961149529 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3615629 Document Type: Article

Times cited : (123)

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