Deflection-voltage curve modelling in atomic force microscopy and its use in DC electrostatic manipulation of gold nanoparticles

Nanotechnology

Volumn 18, Issue 1, 2007, Pages

  Toset, J ^a   Casuso, I ^a   Samitier, J ^a   Gomila, G ^a  

^a UNIVERSITY OF BARCELONA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC FIELD EFFECTS; GOLD; MATHEMATICAL MODELS; NANOSTRUCTURED MATERIALS;

ELECTROSTATIC FORCES; ELECTROSTATIC MANIPULATION; VOLTAGE CURVES;

VOLTAGE MEASUREMENT;

EID: 33846805952     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/18/1/015503     Document Type: Article

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