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Physical Review B - Condensed Matter and Materials Physics

Volumn 83, Issue 22, 2011, Pages

Formation of stacking faults and their correlation with flux pinning and critical current density in Sm-doped YBa2Cu3O 7-δ films

(9) Wee, Sung Hun a Specht, Eliot D a Cantoni, Claudia a Zuev, Yuri L a,b Maroni, Victor c Wong Ng, Winnie d Liu, Guangyao d Haugan, Timothy J e Goyal, Amit a

a OAK RIDGE NATIONAL LABORATORY (United States)

b UNIVERSITY OF TENNESSEE (United States)

c ARGONNE NATIONAL LABORATORY (United States)

d NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

e AIR FORCE RESEARCH LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 79961118747 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.83.224520 Document Type: Article

Times cited : (21)

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