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Volumn 99, Issue 4, 2011, Pages

High resolution, large field of view x-ray differential phase contrast imaging on a compact setup

Author keywords

[No Author keywords available]

Indexed keywords

DIFFERENTIAL PHASE CONTRAST; EXTREME WAVES; FLEXIBLE SUBSTRATE; HIGH RESOLUTION; LABORATORY SET-UP; LARGE FIELD OF VIEWS; MICROCOMPUTED TOMOGRAPHY; WELL-ESTABLISHED TECHNIQUES; X-RAY GRATINGS;

EID: 79961075049     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3618672     Document Type: Article
Times cited : (47)

References (11)
  • 1
    • 79957992651 scopus 로고    scopus 로고
    • Differential x-ray phase contrast imaging using a shearing interferometer
    • DOI 10.1063/1.1516611
    • C. David, B. Nöhammer, H. Solak, and E. Ziegler, Appl. Phys. Lett. 81, 3287 (2002). 10.1063/1.1516611 (Pubitemid 35360566)
    • (2002) Applied Physics Letters , vol.81 , Issue.17 , pp. 3287
    • David, C.1    Nohammer, B.2    Solak, H.H.3    Ziegler, E.4
  • 2
    • 2942701957 scopus 로고    scopus 로고
    • 10.1364/OE.11.002303
    • A. Momose, Opt. Express 11, 2303 (2003). 10.1364/OE.11.002303
    • (2003) Opt. Express , vol.11 , pp. 2303
    • Momose, A.1
  • 5
  • 6
    • 33645795432 scopus 로고    scopus 로고
    • Phase retrieval and differential phase-contrast imaging with low-brilliance X-ray sources
    • DOI 10.1038/nphys265, PII N265
    • F. Pfeiffer, T. Weitkamp, O. Bunk, and C. David, Nat. Phys. 2, 258 (2006). 10.1038/nphys265 (Pubitemid 43553647)
    • (2006) Nature Physics , vol.2 , Issue.4 , pp. 258-261
    • Pfeiffer, F.1    Weitkamp, T.2    Bunk, O.3    David, C.4
  • 8
    • 34247602602 scopus 로고    scopus 로고
    • Fabrication of diffraction gratings for hard X-ray phase contrast imaging
    • DOI 10.1016/j.mee.2007.01.151, PII S0167931707001220, Proceedings of the 32nd International Conference on Micro- and Nano-Engineering
    • C. David, J. Bruder, T. Rohbeck, C. Grünzweig, C. Kottler, A. Diaz, O. Bunk, and F. Pfeiffer, Microelectron. Eng. 84, 1172 (2007). 10.1016/j.mee.2007.01.151 (Pubitemid 46678358)
    • (2007) Microelectronic Engineering , vol.84 , Issue.5-8 , pp. 1172-1177
    • David, C.1    Bruder, J.2    Rohbeck, T.3    Grunzweig, C.4    Kottler, C.5    Diaz, A.6    Bunk, O.7    Pfeiffer, F.8


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.