Digital radiography for the inspection of small defects

Insight: Non-Destructive Testing and Condition Monitoring

Volumn 48, Issue 2, 2006, Pages 109-112

  Blakeley, Bruce ^a   Spartiotis, Konstantinos ^b  

^a TWI LTD   (United Kingdom)

^b Ajat Oy Ltd   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; DETECTORS; IMAGE QUALITY; INSPECTION; NONDESTRUCTIVE EXAMINATION;

DIGITAL DETECTORS; DIGITAL RADIOGRAPHY; PROJECTION MAGNIFICATION;

RADIOGRAPHY;

EID: 32444448099     PISSN: 13542575     EISSN: None     Source Type: Journal    
DOI: 10.1784/insi.2006.48.2.109     Document Type: Article

References (3)

1. K Spartiotis, J Havulinna, A Leppänen and T Pantsar, 'A CdTe real-time X-ray imaging sensor and system', Nuclear Instruments and Methods in Physics Research, 2004.
2. K Spartiotis, A Leppänen and T Pantsar, 'A photon counting CdTe gamma- and X-ray camera', Nuclear Instruments and Methods in Physics Research A 550 (2005) 267-277, 2005.
3. R Halmshaw, 'Industrial radiography, theory and practice', Applied Science Publishers; ISBN 0-85334-105-2, p 148, 1982.