Growth control of single-walled, double-walled, and triple-walled carbon nanotube forests by a priori electrical resistance measurement of catalyst films

Carbon

Volumn 49, Issue 13, 2011, Pages 4368-4375

  Chiang, Wei Hung ^a   Futaba, Don N ^a   Yumura, Motoo ^a   Hata, Kenji ^a,b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CATALYST FILM; DOUBLE-WALLED; ELECTRICAL CHARACTERIZATION; ELECTRICAL RESISTANCE MEASUREMENT; FE CATALYST; GROWTH CONTROL; METAL CATALYST; OUTER DIAMETERS; SINGLE-WALLED; THICKNESS VARIATION; TRIPLE-WALLED CARBON NANOTUBE;

ALGEBRA; CARBON FILMS; CHEMICAL VAPOR DEPOSITION; CHEMICALS REMOVAL (WATER TREATMENT); ELECTRIC RESISTANCE; HIGH RESOLUTION ELECTRON MICROSCOPY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MULTIWALLED CARBON NANOTUBES (MWCN); SHEET METAL; SHEET RESISTANCE; SINGLE-WALLED CARBON NANOTUBES (SWCN); TRANSMISSION ELECTRON MICROSCOPY; WATER VAPOR;

CATALYSTS;

EID: 79961025077     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.carbon.2011.06.015     Document Type: Article

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