MAX phase formation by intercalation upon annealing of TiCx/Al (0.4 ≤ x ≤ 1) bilayer thin films

Acta Materialia

Volumn 59, Issue 15, 2011, Pages 6168-6175

  Abdulkadhim, Ahmed ^a   Takahashi, Tetsuya ^a   Music, Denis ^a   Munnik, Frans ^b   Schneider, Jochen M ^a  

^a RWTH AACHEN UNIVERSITY   (Germany)

^b INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

Author keywords

Annealing; Bilayer; Intercalation; MAX phases; Thin film

Indexed keywords

ANNEALING TEMPERATURES; BI-LAYER; BILAYER THIN FILMS; ELASTIC RECOIL DETECTION ANALYSIS; ENERGY DISPERSIVE X-RAY; LATTICE SPACING; MAX PHASES; MAX PHASIS; PHASE FORMATIONS; SPACE GROUPS;

ALUMINUM; ANNEALING; INTERMETALLICS; THIN FILMS; X RAY DIFFRACTION;

TITANIUM CARBIDE;

EID: 79961016740     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2011.06.029     Document Type: Article

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