Low-temperature instability of Ti2SnC: A combined transmission electron microscopy, differential scanning calorimetry, and x-ray diffraction investigations

Journal of Materials Research

Volumn 24, Issue 1, 2009, Pages 39-49

  Zhang, J ^a,b   Liu, B ^a,b   Wang, J Y ^a   Zhou, Y C ^a  

^a INSTITUTE OF METAL RESEARCH   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; DIFFERENTIAL SCANNING CALORIMETRY; DIFFRACTION; ELECTRON BEAMS; ELECTRON MICROSCOPES; LASER INTERFEROMETRY; LATTICE CONSTANTS; SCANNING; TERNARY SYSTEMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

BULK CERAMICS; COOLING PROCEDURES; ELECTRON BEAM IRRADIATIONS; LOW TEMPERATURES; ORIENTATION RELATIONSHIPS; REHEATING TEMPERATURES; TEM; X-RAY DIFFRACTION INVESTIGATIONS; X-RAY DIFFRACTIONS; XRD ANALYSIS;

TIN;

EID: 61749090632     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2009.0012     Document Type: Article

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