|
Volumn 58, Issue 13, 2010, Pages 4362-4368
|
Radiation tolerance of Mn+1AXn phases, Ti 3AlC2 and Ti3SiC2
|
Author keywords
Ceramics; Electron diffraction; Ion beam processing; Titanium; Transmission electron microscopy (TEM)
|
Indexed keywords
ALUMINUM;
CARBIDES;
ELECTRON DIFFRACTION;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
ION BEAMS;
NUCLEAR REACTORS;
TITANIUM;
TRANSMISSION ELECTRON MICROSCOPY;
ARGONNE NATIONAL LABORATORY;
CERAMICS;
HIGH RADIATION RESISTANCE;
ION BEAM PROCESSING;
NOVEL MATERIALS;
NUCLEAR TECHNOLOGY;
RADIATION TOLERANCES;
TERNARY CARBIDE;
SILICON CARBIDE;
|
EID: 79953315832
PISSN: 13596454
EISSN: None
Source Type: Journal
DOI: 10.1016/j.actamat.2010.04.029 Document Type: Article |
Times cited : (203)
|
References (23)
|