A microcantilever investigation of size effect, solid-solution strengthening and second-phase strengthening for 〈a〉 prism slip in alpha-Ti

Acta Materialia

Volumn 59, Issue 15, 2011, Pages 5970-5981

  Gong, Jicheng ^a   Wilkinson, Angus J ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Focused ion beam; Micromechanical modelling; Nanoindentation; Plastic deformation; Titanium

Indexed keywords

BACK STRESS; BEAM SIZE; CRITICAL RESOLVED SHEAR STRESS; CRYSTAL PLASTICITY FINITE ELEMENT; INVERSE PROCESS; LOAD-DISPLACEMENT DATA; MICRO-CANTILEVERS; MICROMECHANICAL MODELLING; NANOINDENTOR; NEUTRAL AXIS; SAMPLE SIZES; SECOND-PHASE; SIZE EFFECTS; SOLUTION STRENGTHENING; TI-6AL-4V;

ALUMINUM; CHEMICAL SENSORS; COMPOSITE MICROMECHANICS; CRYSTAL ORIENTATION; DISLOCATIONS (CRYSTALS); FINITE ELEMENT METHOD; FOCUSED ION BEAMS; NANOCANTILEVERS; NANOINDENTATION; TITANIUM;

STRENGTHENING (METAL);

EID: 79961000547     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2011.06.005     Document Type: Article

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